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Defect positioning method based on frequency spectrum technology and assertion switching technology

A positioning method and technology, applied in instruments, electrical digital data processing, computing and other directions, can solve problems such as accuracy and efficiency need to be improved, difficult positioning, etc., to achieve more accurate defect positioning, fast defect positioning, and improved accuracy. Effect

Pending Publication Date: 2022-03-08
HANGZHOU DIANZI UNIV
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AI Technical Summary

Problems solved by technology

Therefore, the combination of dynamic slicing technology and spectrum technology has become an important development direction. Although the combination of the two effectively solves the problems of spectrum technology, it is still difficult to locate missing defects in large-scale projects in reality. , the accuracy and efficiency of this combined technology need to be improved

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  • Defect positioning method based on frequency spectrum technology and assertion switching technology
  • Defect positioning method based on frequency spectrum technology and assertion switching technology
  • Defect positioning method based on frequency spectrum technology and assertion switching technology

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Embodiment Construction

[0046] like figure 1 As shown, the present invention mainly includes three parts: slice acquisition based on assertion switching technology, suspicious list acquisition based on spectrum technology, and combined calculation of a new suspicious list.

[0047] Step 1: slice acquisition based on assertion switching technology;

[0048] Slice acquisition based on assertion switching technology includes four steps: failed test statistics, key assertion search, slice acquisition, and slice fusion;

[0049] Step 1-1: Statistics of failed test cases

[0050] In the provided test cases, there are successful test cases and failed test cases, and some error programs have more than one failed test cases, so all the failed test cases should be counted and screened out for subsequent steps;

[0051] Step 1-2: Find key assertions

[0052] Assertion switching technology is to find key assertions by dynamically switching the results of assertions. The assertion switching technology adopted ...

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Abstract

The invention relates to a defect positioning method based on a frequency spectrum technology and an assertion switching technology. The method mainly considers how to obtain a more accurate slice and how to combine the slice with a suspicious list, and comprises the following steps: firstly, finding out all key assertions for a failure test of a program by using an assertion switching technology; then slicing the failed test to obtain slices; secondly, analyzing the program by adopting a frequency spectrum technology, namely, collecting frequency spectrum information by all test cases for executing the program, and calculating all suspicious elements and corresponding suspicious degree scores by utilizing the frequency spectrum information; and finally, recalculating a new suspicious list based on the obtained slices and the suspicious degree score to position the defect. According to the invention, positioning of some missing defects by a slice and frequency spectrum combination technology is enhanced, and the positioning accuracy and efficiency after combination of the slice and frequency spectrum technologies are further improved.

Description

technical field [0001] The invention belongs to the field of software defect location and relates to a software defect location method based on frequency spectrum technology and assertion switching technology. Background technique [0002] In the process of software development and maintenance, software debugging usually occupies a lot of resources in a project. Software debugging is to find errors in the code. For software development and maintenance, it is an inevitable process to find code fragments that need to be repaired. Using defect location technology can not only improve the efficiency of finding defects but also improve the accuracy of defect repairing. sex. [0003] In recent decades, many defect localization techniques have been proposed to improve the efficiency and productivity of debug engineering. Spectrum technology collects the coverage information of test case execution to calculate the suspicion score of program entities to explore the relationship bet...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3672G06F11/3688
Inventor 方景龙谢世豪魏丹陈滨王兴起
Owner HANGZHOU DIANZI UNIV
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