Brightness temperature imaging method for multilayer covering medium
An imaging method and medium technology, which is applied in the field of radiation emission, can solve the problems that affect the accuracy of transmission simulation imaging, do not consider total reflection, transmittance error, etc., and achieve the effects of improving efficiency, improving accuracy, and reducing tracking
Pending Publication Date: 2022-03-29
HANGZHOU DIANZI UNIV
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Since the traditional transmission model does not consider the total reflection in the real transmission, when calculating the integrated area selected for the transmission rate, the entire lower hemisphere is added to the calculation, resulting in errors in the calculated transmission rate, which affects the accuracy of the entire layer transmission simulation imaging Spend
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[0026] Below in conjunction with accompanying drawing, the present invention will be further explained;
[0027] A bright temperature imaging method for a multi-layer covering medium, specifically comprising the following steps:
[0028] Step 1. Use gmsh software for physical modeling to obtain a unit sphere model.
[0029] Step 2. Use the gmsh software to perform 2D subdivision on the surface of the unit sphere model obtained in step 1. Select a triangle as the subdivision unit. The subdivision results are as follows: figure 1 shown.
[0030] Step 3: Divide step 2 to obtain the connection between the center point of each triangular unit and the center of the unit sphere model, and the direction from the center point to the center point is the scattering direction. A three-dimensional Cartesian coordinate system is established with the center of the unit sphere model as the origin, the coordinates of the center point of the triangular unit are (x, y, z), and the pitch angle ...
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The invention discloses a brightness temperature imaging method for a multi-layer covering medium. A traditional transmission model does not consider total reflection in real transmission, and when an integral area selected for calculating transmissivity is calculated, the whole lower hemispherical surface is added for calculation, so that the calculated transmissivity has an error, and the accuracy of transmission simulation imaging of the whole layer is influenced. Therefore, a novel transmission model is provided for a covered scene to obtain a brightness temperature matrix with higher precision. The method specifically comprises the following steps: 1, proposing an improved model conforming to actual transmission characteristics on the basis of a traditional model; 2, the relationship between a bistatic scattering transmission coefficient and a transmission angle is researched; and 3, establishing a brightness temperature distribution diagram in the detected area. And 4, comparing various indexes of the traditional model with various indexes of the new model. According to the method, the brightness temperature image for the covered scene can be more accurately obtained, so that the accuracy of passive millimeter wave multilayer imaging simulation is further improved, and the calculation time of simulation imaging can be shortened.
Description
technical field [0001] The technical field of radiation emission of the present invention specifically relates to a bright temperature imaging method for a multi-layer covering medium. Background technique [0002] Passive millimeter-wave imaging simulation is an important link in the field of passive millimeter-wave imaging. It can help to understand the radiation characteristics of targets, explain radiation phenomena, find radiation laws and judge the pros and cons of actual measurement results. The advantages mentioned above have made millimeter wave imaging simulation more and more important in recent years. [0003] Most of the researches on brightness temperature imaging in the prior art focus on a single-layer covering medium, but there is little mention of brightness temperature imaging under a multi-layer covering medium. Since the traditional transmission model does not consider the total reflection in the real transmission, when calculating the integrated area s...
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Login to View More IPC IPC(8): G06F30/23G06T17/20G01J5/48
CPCG06F30/23G06T17/20G01J5/48G01J2005/0077
Inventor 尹川朱昊辰张鹏泉耿友林张忠海韦杜鹃
Owner HANGZHOU DIANZI UNIV