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Electronic device low-temperature modeling method and device suitable for quantum measurement and control system

A technology of electronic devices and measurement and control systems, applied in the field of low-temperature modeling of electronic devices, can solve problems such as inability to simulate low-temperature circuits, achieve good promotion and application value, meet simulation needs, and save research and development time and cost.

Pending Publication Date: 2022-04-01
INSPUR GROUP CO LTD
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  • Abstract
  • Description
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Problems solved by technology

The operating characteristics of electronic devices will change in low temperature environments, and conventional device models cannot simulate low temperature circuits, so it is necessary to accurately model devices in low temperature working environments

Method used

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  • Electronic device low-temperature modeling method and device suitable for quantum measurement and control system

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Embodiment

[0036] Such as figure 1 As shown, the method for low-temperature modeling of electronic devices suitable for quantum measurement and control systems of the present invention selects transistors for measurement in a low-temperature environment, and establishes a low-temperature model of electronic devices on the basis of test data, which specifically includes the following steps:

[0037] S1. Put the electronic device test sample into the low temperature chamber.

[0038] Solder the electronic device test sample to the bare PCB, and send it into the low temperature chamber through the test rod.

[0039] S2. Measuring the parameters of the electronic device test sample in a low temperature environment.

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Abstract

The invention discloses an electronic device low-temperature modeling method and device suitable for a quantum measurement and control system, and belongs to the technical field of quantum measurement and control. According to the electronic device low-temperature modeling method suitable for the quantum measurement and control system, a transistor is selected to be measured in a low-temperature environment, and a low-temperature model of an electronic device is established on the basis of test data. According to the electronic device low-temperature modeling method suitable for the quantum measurement and control system, the low-temperature circuit simulation requirement can be met, the research and development time and cost are saved, and good application and popularization value is achieved.

Description

technical field [0001] The invention relates to the technical field of quantum measurement and control, and specifically provides a method and device for low-temperature modeling of electronic devices suitable for quantum measurement and control systems. Background technique [0002] Quantum computer is considered to be the most potential technical route among various technical branches and has received extensive attention. Commonly used superconducting quantum chips work in a low temperature environment, while the measurement and control system works in a normal temperature environment, and the two are interconnected through cables. In order to realize the measurement and control of more qubit chips, it is necessary to design a measurement and control circuit that works in a low temperature environment. The operating characteristics of electronic devices will change in low temperature environments, and conventional device models cannot simulate low temperature circuits, so...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06N10/20
Inventor 关盈
Owner INSPUR GROUP CO LTD
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