Measuring device and measuring system
A measuring device, vector technology, applied in the direction of electronic circuit testing, etc.
Pending Publication Date: 2022-04-12
BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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[0003] In order to solve the technical problem of radio frequency chip port parameter measurement, the application provides a measurement device and measurement system
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[0040] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, but not all of them. Based on the embodiments in the present application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present application.
[0041] The first embodiment of the present application provides a measuring device, such as figure 1 , including: a vector source 100 , a switch matrix 101 , a signal separation device 102 and a receiver 103 .
[0042]The vector source 100 is connected to a switch matrix 101, and the switch matrix 101 is respectively connected to a sig...
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The invention relates to a measuring device and a measuring system, and belongs to the technical field of microwave measurement. The measuring device comprises a vector source, a switch matrix, a signal separation device and a receiver, the vector source is connected with the switch matrix, and the switch matrix is connected with the signal separation device, the receiver and a to-be-tested piece; the vector source is used for providing measured excitation signals for the signal separation device through the switch matrix; the signal separation device is used for generating an incident signal, a reflected signal and a transmission signal based on the excitation signal and separating the incident signal, the reflected signal and the transmission signal; and the receiver is used for obtaining a measurement result. According to the measuring device, path selection is carried out by using the switch matrix, measurement results of incident signals, reflected signals and transmission signals can be conveniently and quickly obtained through the signal separation device and the receiver, port parameter measurement of a to-be-measured piece is realized, the technical problem of radio frequency chip port parameter measurement is solved, and the performance of a radio frequency chip is further verified.
Description
technical field [0001] The present application relates to the field of microwave measurement technology, in particular to a measurement device and a measurement system. Background technique [0002] At present, radar, satellite communication, wireless communication and other fields are developing rapidly. In the RF transceiver link of the corresponding system, the performance of the RF chip has an increasing impact on the performance of the entire system. Nowadays, the update speed of the RF chip is still increasing, and the signal frequency The continuous improvement of the structure and function, the miniaturization of the area, the lower power consumption and the lower price, such a development trend places high hopes on the design and manufacture of RF chips, and also puts forward more stringent requirements. Furthermore, higher standard requirements are put forward for the test and verification of RF chips. The port parameter measurement occupies a major position in th...
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IPC IPC(8): G01R31/28
Inventor 李明军刘延迪王奇之李晶郑永丰
Owner BEIJING AEROSPACE MEASUREMENT & CONTROL TECH