Structure defect rapid identification and classification method based on lightweight deep learning model
A deep learning and structural defect technology, applied in the field of defect identification, can solve the problem of low accuracy of identification technology, and achieve the effect of accelerating training speed and identification speed, improving model learning rate, and small model size.
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[0022] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings. It should be noted here that the descriptions of these embodiments are used to help understand the present invention, but are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below may be combined with each other as long as they do not constitute a conflict with each other.
[0023] see figure 1 The flow chart of the rapid identification and classification method for structural defects based on the lightweight deep learning model shown in the embodiment includes:
[0024] S101. Use the VGG16-U-Net model to perform semantic segmentation processing on the collected defect images to remove image background noise interference.
[0025] see figure 2 The VGG16-U-Net model structural diagram that embodiment provides;
[0026] The VGG16-U-Net mo...
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