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Method and system for time-to-digital conversion

A time-to-digital conversion and time-to-digital technology, applied in the circuit field, can solve the problems of time delay, large storage space, occupation, etc., and achieve the effect of fine interval and high measurement accuracy

Pending Publication Date: 2022-06-17
NINGBO SUNNY AUTOMOTIVE OPTECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

There are some problems with this method, such as: the amount of data required is too large, thus occupying a large storage space; more complex mathematical processing is required for these data, thus occupying more design resources; in addition, each time calibration is performed, TDC is required Stop the timing work and enter the calibration mode, and the calibration process will take a certain amount of

Method used

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  • Method and system for time-to-digital conversion

Examples

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[0049]为了更好地理解本申请,将参考附图对本申请的各个方面做出更详细的说明。应理解,这些详细说明只是对本申请的示例性实施方式的描述,而非以任何方式限制本申请的范围。另外还需要说明的是,为了便于描述,附图中仅示出了与有关发明相关的部分。

[0050]应注意,在本说明书中,第一、第二、第三等的表述仅用于将一个特征与另一个特征区分开来,而不表示对特征的任何限制。因此,在不背离本申请的教导的情况下,下文中讨论的第一时间数字转换器也可被称作第二时间数字转换器。反之亦然。

[0051]如在本文中使用的,用语“大致”、“大约”以及类似的用语用作表近似的用语,而不用作表程度的用语,并且旨在说明将由本领域普通技术人员认识到的、测量值或计算值中的固有偏差。

[0052]还应理解的是,用语“包括”、“包括有”、“具有”、“包含”和 / 或“包含有”,当在本说明书中使用时表示存在所陈述的特征、元件和 / 或部件,但不排除存在或附加有一个或多个其它特征、元件、部件和 / 或它们的组合。此外,当诸如“...中的至少一个”的表述出现在所列特征的列表之后时,修饰整个所列特征,而不是修饰列表中的单独元件。此外,当描述本申请的实施方式时,使用“可”表示“本申请的一个或多个实施方式”。并且,用语“示例性的”旨在指代示例或举例说明。

[0053]除非另外限定,否则本文中使用的所有措辞(包括工程术语和科技术语)均具有与本申请所属领域普通技术人员的通常理解相同的含义。还应理解的是,除非本申请中有明确的说明,否则在常用词典中定义的词语应被解释为具有与它们在相关技术的上下文中的含义一致的含义,而不应以理想化或过于形式化的意义解释。

[0054]需要说明的是,在不冲突的情况下,本申请中的实施例及实施例中的特征可以相互组合。另外,除非明确限定或与上下文相矛盾,否则本申请所记载的方法中包含的具体步骤不必限于所记载的顺序,而可以任意顺序执行或并行地执行。下面将参考附图并结合实施例来详细说明本申请。

[0055]参考图1,本申请实施例提供一种用于确定时间数字转换器的温度系数的方法1000,包括如下步骤:

[0056]S1010,在一种温度条件下,向时间数字转换器发送标定信号。标定信号中包括大量的被标定了时刻的脉冲。

[0057]S1040,获得标定信号具有的基准时刻。标定信号具有的基准时刻可以基于外部设备确定,例如低温漂晶振时钟。

[0058...

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Abstract

The invention provides a method for time-to-digital conversion. The method comprises the following steps: under at least three temperature conditions, sending a calibration signal to a time-to-digital converter; obtaining a reference moment of the calibration signal; obtaining the time length of a delay unit output by the time-to-digital converter under each temperature condition; obtaining a calibration temperature of the time-to-digital converter corresponding to each temperature condition through a temperature sensor; and determining the temperature coefficient of the time-to-digital converter based on the time duration of the delay unit under the at least three temperature conditions, the calibration temperature and the reference moment. Obtaining the temperature of the time-to-digital converter when receiving the signal to be measured; obtaining time data corresponding to the to-be-detected signal through a time-to-digital converter; determining a temperature coefficient corresponding to the time-to-digital converter; and determining a corrected moment corresponding to the to-be-measured signal based on the time data, the temperature and the temperature coefficient.

Description

technical field [0001] The present application relates to the field of circuit technology, and more specifically, to a method for determining the temperature coefficient of a time-to-digital converter, a method for correcting a time-to-digital conversion system, a method for time-to-digital conversion, a system for time-to-digital conversion, and a laser radar. Background technique [0002] A Time to Digital Converter (Time to Digital Converter, TDC) is used to convert the time interval information into a digital signal, so as to realize the measurement of the time interval by the circuit. Time interval measurement, especially precise time interval measurement, is required in navigation, lidar ranging, ultrasonic ranging, space technology, remote sensing imaging, communication and other fields. [0003] Field Programmable Gate Array (Field Programmable Gate Array, FPGA) device belongs to a semi-custom circuit in ASIC. A large number of resources are integrated in the FPGA d...

Claims

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Application Information

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IPC IPC(8): G04F10/00
CPCH03K19/177
Inventor 张伟邹艳霞王柄杰李琴王强杨佳张晓峰王文星
Owner NINGBO SUNNY AUTOMOTIVE OPTECH