Edge phase effect removal using wavelet correction and particle classification using combined absorption and phase contrast

A particle and edge information technology, applied in 2D image generation, instrumentation, computing, etc., to solve problems such as imaging speed limitations, incompatibility of supported drugs, and inability to estimate surface scanning methods well

Active Publication Date: 2022-07-15
卡尔蔡司有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These methods have imaging speed limitations when processing a batch of samples
Furthermore, surface scanning methods are not good at estimating the size of three-dimensional (3D) particles, which are often irregularly shaped
In addition, these analytical modalities may not be compatible with aerosol-supported drugs in a vacuum environment

Method used

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  • Edge phase effect removal using wavelet correction and particle classification using combined absorption and phase contrast
  • Edge phase effect removal using wavelet correction and particle classification using combined absorption and phase contrast
  • Edge phase effect removal using wavelet correction and particle classification using combined absorption and phase contrast

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Embodiment Construction

[0042] The present invention will be described more fully hereinafter with reference to the accompanying drawings, in which illustrative embodiments of the invention are shown. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

[0043] As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items. In addition, the singular forms and the articles "a" (a), "an" (an) and "the" (the) also include the plural forms unless expressly stated otherwise. It will be further understood that when used in this specification, the terms "includes", "comprises", "including" and / or "comprising" specify the recited features, The presence of an integer, step, operation, element, and / or ...

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Abstract

An x-ray microscopy method obtains a classification of different particles by distinguishing between different material phases in conjunction with image processing including morphological edge enhancement and potentially distinguishable differences in absorption contrast between the phases, and optionally wavelet filtering.

Description

[0001] Related applications [0002] This application claims the benefit of US Provisional Application No. 62 / 951,857, filed December 20, 2019, under 35 USC 119(e), the entire contents of which are incorporated herein by reference. Background technique [0003] Heterogeneous materials typically include particles with two or more phases of materials in which the different phases have different chemistries, where the different chemistries have density differences that may not be significant and / or different structures such as amorphous or crystalline or different crystalline structures. Process control and quality inspection of these materials requires the investigation of large numbers of these particles and the identification of the different material phases, especially the relative volume fractions of the different material phases, as well as other characterization measures. [0004] An example of such a multiphase material is an inhaler for drug delivery. Powder formulatio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T11/00
CPCG06T11/008G06T2211/461G06T7/13G06T7/155G06V20/70G06V10/764G01N23/20G01N23/2206G01N23/223G01N2223/045G01N2223/056G01N2223/076G01N2223/419G06T2207/10121G06T2207/20021G06T2207/20036G06T2207/20212
Inventor 马修·安德鲁拉斯·奥马尔赫里希凯什·贝尔克里斯托夫·格拉夫·沃姆·哈根
Owner 卡尔蔡司有限公司
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