Edge phase effect removal using wavelet correction and particle classification using combined absorption and phase contrast
A particle and edge information technology, applied in 2D image generation, instrumentation, computing, etc., to solve problems such as imaging speed limitations, incompatibility of supported drugs, and inability to estimate surface scanning methods well
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[0042] The present invention will be described more fully hereinafter with reference to the accompanying drawings, in which illustrative embodiments of the invention are shown. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
[0043] As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items. In addition, the singular forms and the articles "a" (a), "an" (an) and "the" (the) also include the plural forms unless expressly stated otherwise. It will be further understood that when used in this specification, the terms "includes", "comprises", "including" and / or "comprising" specify the recited features, The presence of an integer, step, operation, element, and / or ...
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