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Efficient data aware media reliability scanning

A valid data and effective technology, applied in the direction of electrical digital data processing, input/output process of data processing, memory address/allocation/relocation, etc., can solve problems such as lost programming state

Inactive Publication Date: 2022-07-29
MICRON TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Volatile memory cells, such as DRAM cells, can lose their programmed state over time unless periodically refreshed by an external power source

Method used

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  • Efficient data aware media reliability scanning
  • Efficient data aware media reliability scanning
  • Efficient data aware media reliability scanning

Examples

Experimental program
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Embodiment Construction

[0016] A system may include a host system and a memory system that stores host system data. For example, a memory system may include NAND memory cells that store logic states. Memory systems can be made smaller and smaller to reduce the size the memory system occupies in the system, eg, to meet market demands. For example, NAND media continues to grow in technical complexity and decrease in size. As memory systems get smaller, inherent data storage reliability may come under increasing pressure. In some cases, as the size of the memory cell decreases, the magnitude of the voltage used to program the first logic state may approach the second voltage used to program the second logic state, eg, the memory cell is more likely from the desired The logic state drifts to an undesired logic state and thus reduces the reliability of data storage in the memory system. A common way to reduce reliability issues is to periodically scan the data stored in the memory system to assess the ...

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Abstract

The invention relates to a valid data aware media reliability scan. An apparatus may include a memory array including a plurality of blocks and a controller coupled with the memory array. The controller may be configured to select a block of the plurality of blocks for a scan operation to determine a reliability margin for a first data set stored in the block. The controller may identify information associated with a state of validity of a sub-block of the first data set in the block. The controller may determine, based on identifying the information, a first subset of the sub-blocks that store valid data of the first data set and a second subset of sub-blocks that are invalid. The controller may perform the scan operation on the first subset of sub-blocks in the block instead of the second subset of sub-blocks.

Description

[0001] cross reference [0002] This application claims priority to US Patent Application No. 17 / 153,068, filed January 20, 2021, by Palmer, entitled "VALID DATA AWARE MEDIA RELIABILITY SCANNING," Said US patent application is assigned to the present assignee and is expressly incorporated herein by reference in its entirety. technical field [0003] The technical field relates to valid data-aware media reliability scanning. Background technique [0004] Memory devices are widely used to store information in various electronic devices such as computers, wireless communication devices, cameras, digital displays, and the like. Information is stored by programming memory cells within a memory device to various states. For example, a binary memory cell can be programmed to one of two supported states, often corresponding to a logic 1 or a logic 0. In some examples, a single memory cell may support more than two possible states, and the memory cell may store any of the more th...

Claims

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Application Information

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IPC IPC(8): G11C29/32
CPCG11C29/32G06F3/0679G06F3/064G06F3/0619G06F2212/7209G06F12/0246G06F3/0653G06F2212/657G06F12/10
Inventor D·A·帕尔默
Owner MICRON TECH INC