Multi-batch crystal circle attribute number revising method

A technology of attribute numbering and attribute modification, applied in special data processing applications, instruments, electrical digital data processing, etc., to achieve the effect of saving the time of manual operation

Inactive Publication Date: 2007-05-30
MACRONIX INT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The main purpose of the present invention is to propose a method for modifying the attribute number of multiple batches of wafers. When multiple batches of wafers need to modify the attribute number, to solve the problem that only a single batch of wafers can modify the attribute number.

Method used

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  • Multi-batch crystal circle attribute number revising method
  • Multi-batch crystal circle attribute number revising method
  • Multi-batch crystal circle attribute number revising method

Examples

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Embodiment Construction

[0020] Fig. 2 is the flow chart of modifying attribute numbering of the present invention, at first step S10 imports the text file of many batches of modifying attribute numbering data, then step S11 transmits and revises attribute numbering data in batches, step S12 executes the schedule modification attribute numbering, then step S13 Determine whether the modification of the attribute number is successful, if yes, go to step S14, otherwise go to step S15. The step S14 ends, and after a reference time, the modified attribute number data is sent in batches in step S11 until there is no modified attribute number data. In step S15, the system automatically rewrites the text file whose attribute number fails to be modified, and then executes step S11 to transmit the modified attribute number data in batches. Utilizing this method can improve the known automation system, when modifying the attribute numbering method, only one data change can be written at a time, and it is impossi...

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Abstract

In the invention, each batch of wafer possesses a number of batch and number of first attribute. The method writes down character data of number of batch and numbers of first attribute and second attribute for the number of its attribute to be modified. Number of batch and numbers of first attribute and second attribute are read into system in batch mode. Based on information returned back, the system determines whether modification is successful or not. If not, the data can be written into a temporary storage disk. When process of the said character data is finished, all data not successful stored in temporary storage disk are reprocessed again. Repeated operations are carried out till no data in the said temporary storage disk.

Description

technical field [0001] The invention relates to a method for modifying attribute numbers of wafers, in particular to a method for continuously modifying attribute numbers of multiple batches of wafers. Background technique [0002] With the advancement of electronic technology, the application of integrated circuits (ICs) has become more and more extensive, thus increasing the wafer manufacturing output of the fab. Due to the increase in wafer manufacturing output and the different applications of ICs, it is difficult to manage the differences in wafer manufacturing. Therefore, a lot (lot) management method is adopted. A lot is a group of single-type goods that are manufactured together and receive the same quality. control and processing. A batch has a batch of attribute number data (lot's order data), the batch attribute number data includes a product, a delivery deadline date (commit due date), a delivery deadline time (commit duetime), lot owner (lot owner) and owner d...

Claims

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Application Information

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IPC IPC(8): G06F17/00H01L21/00G06Q10/00
Inventor 杜坤政庄宇辰叶雅
Owner MACRONIX INT CO LTD
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