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Method and appts. of eliminating KTC noise in linear CMOS imaging sensor

A pixel and branch line technology applied in the field of eliminating kTC noise in linear image sensors

Inactive Publication Date: 2003-10-08
OMNIVISION TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, such pixels require additional manufacturing process steps, as well as additional time requirements for operation

Method used

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  • Method and appts. of eliminating KTC noise in linear CMOS imaging sensor
  • Method and appts. of eliminating KTC noise in linear CMOS imaging sensor
  • Method and appts. of eliminating KTC noise in linear CMOS imaging sensor

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Embodiment Construction

[0012] In the following description, numerous specific details are provided, such as the identification of various system components, in order to provide a thorough understanding of embodiments of the invention. However, it will be understood by those skilled in the art that the present invention may be practiced without one or more of the specific details, or with other methods, components, materials, and the like. In yet another instance, well-known structures, materials, or operations are not shown or described in detail so as not to obscure the characteristics of various embodiments of the invention.

[0013] Reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment of the present invention. Thus, appearances of the phrases "in one embodiment" or "in an embodiment" in various places throughout the specificatio...

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Abstract

A method of reading out a pixel signal from a pixel is disclosed. The method comprises first capturing a first black reference signal from the pixel prior to the pixel starting an integration period. Next, after completion of the integration period, a pixel signal is captured. Next, a second black reference signal is captured following completion of the integration period. Finally, the first black reference signal, second black reference signal, and pixel signal is output.

Description

technical field [0001] The present invention relates generally to CMOS image sensors, and more particularly, the present invention relates to methods and circuits for removing kTC noise in linear image sensors. Background technique [0002] Integrated circuit technology has revolutionized a variety of different fields including computers, control systems, telecommunications and imaging. For example, in the field of imaging, CMOS image sensors have proven to be less expensive to manufacture relative to CCD imaging devices. Also, for some applications, CMOS devices are superior in performance. For example, the necessary signal processing logic can be integrated on the side of the imaging circuit, thus allowing a single integrated chip to form a completely independent imaging device. [0003] Despite advances in CMOS image sensor technology, there are still issues preventing their widespread acceptance. One such problem is the "kTC" noise introduced in CMOS pixels during res...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N25/00
CPCH04N5/361H04N25/67H04N25/78H04N25/63
Inventor H·杨X·何Q·单
Owner OMNIVISION TECH INC