Collecting and controlling system and method for test data
A technology for testing data and control systems, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve problems such as time-consuming and labor-intensive, inaccurate recording of test results, and inability to truly reflect the production status of motherboard production lines. , to achieve the effect of solving the waste of human and material resources
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[0014] Such as figure 1 Shown is a hardware architecture diagram of the test data collection management and control system of the present invention. The system includes multiple test machines 10 , an application server 11 , a connection 12 , a test data database 13 , a production site management database 14 , and a network 15 . Wherein a plurality of test machines 10 are used to carry out a series of tests related to the motherboard, including tests such as open circuit, closed circuit, parts use, motherboard interface compatibility of the printed circuit board, and each test machine corresponds to a test content, After the motherboard passes through all the test machines according to the set test sequence, it indicates that the motherboard test is over. The application server 11 includes a plurality of software function modules, which are used to collect and control various test data, receive test data from the test machine 10, query test data, determine test data, update te...
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