Melthod for realizing searching new position of person's face feature point by tow-dimensional profile
Patent Information
- Authority / Receiving Office
- CN ยท China
- Current Assignee / Owner
- SHANGHAI JIAO TONG UNIV
- Publication Date
- 2006-06-14
- Estimated Expiration
- Not applicable ยท inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a method in the technical field of image processing, in particular to a method for searching new positions of facial feature points by using two-dimensional contours. Background technique
[0002] As an important branch of biometric recognition, face recognition has received more and more attention. In the past ten years, a lot of research results have been achieved in this field, some of which have been applied to real life, such as face detection, face recognition etc., while the location of facial feature points is the core technology in face recognition, and the accuracy of feature point location directly affects the accuracy of recognition. Therefore, accurately locating a large number of facial feature points can greatly improve the accuracy of recognition. The existing face feature location methods are mainly divided into two categories: one is the local feature location method, and the other is the global feature point...