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Tools for grinding samples of detection for electron microscope

A technology for microscope inspection and grinding tools, used in grinding tools, grinding/polishing hand tools, manufacturing tools, etc., can solve problems such as inability to obtain samples, easy sliding, and difficulty for users to grip T-shaped grinding tools.

Inactive Publication Date: 2010-04-28
SEMICON MFG INT (SHANGHAI) CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, it is time-consuming and impossible to obtain samples with accurate horizontal viewing surfaces with existing T-shaped grinding tools
[0004] When using the existing T-shaped grinding tool to grind the sample, the user holds the existing T-shaped grinding tool with three fingers, because the three faces of the user's three fingers in contact with the existing T-shaped grinding tool Both are smooth surfaces, easy to slide during grinding, and it is not easy for users to hold T-shaped grinding tools

Method used

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  • Tools for grinding samples of detection for electron microscope
  • Tools for grinding samples of detection for electron microscope
  • Tools for grinding samples of detection for electron microscope

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Experimental program
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Embodiment Construction

[0026] The grinding tool for detecting samples by electron microscope of the present invention will be described below in conjunction with the accompanying drawings.

[0027] figure 2 It shows a T-shaped grinding tool used for manufacturing microscope inspection samples according to an embodiment of the present invention. The T-shaped grinding tool includes: a base 10 with a T-shaped structure; upper screw 11, left screw 12, right screw 13, locking screw 14; sample base 15; and two precision levels 17 and fixed rubber stoppers 18. The left screw 12 and the right screw 13 are symmetrically arranged at both ends of the T-shaped base, the upper screw 11 is arranged at the vertical end of the T-shaped base; the locking screw 14 is arranged at the middle position of the T-shaped base-vertical ; The sample base 15 is set on a side of a vertical end of the T-shaped base. Two spirit levels are respectively arranged on a vertical part and a horizontal part of the T-shaped base, and ...

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Abstract

The present invention relates to a T-shaped grinding tool for making microscope detection sample. Said T-shaped grinding tool includes the following several portions: base A with T-shaped structure, upper screw A1, left screw A2, right screw A3, locking screw A4 and sample base seat A5. It is characterized by that it also includes two precision levelers A7 and fixing rubber plug A8. Said inventionalso provides the connection mode of all the above-mentioned portions, and the operation method of said T-shaped grinding tool.

Description

technical field [0001] The invention relates to a grinding tool for a sample detected by an electron microscope, which is used for grinding a sample detected by a scanning electron microscope and / or a transmission electron microscope. Background technique [0002] The currently used T-shaped grinding tool for grinding scanning electron microscope and / or transmission electron microscope to detect samples uses three screws to adjust the direction of the sample up, down, left, right, front and back. The level adjustment of the front and rear directions of the sample cannot be carried out, and the level of the sample cannot be accurately determined. Usually, the level of the sample can only be roughly estimated by the user's visual inspection, resulting in the inclination of the front and rear directions of the sample, and the required sample observation plane cannot be obtained. . [0003] figure 1 It is a perspective view of an existing T-shaped grinding tool for manufacturi...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B24D15/00B24B49/00G01N1/00G01C5/00B24B37/11
Inventor 秦立勇邹丽君陈强陈险峰
Owner SEMICON MFG INT (SHANGHAI) CORP