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Device and method for measuring the profile of a surface

A technology for measuring surfaces and contours, applied to measuring devices, optical devices, instruments, etc., can solve problems such as high cost

Inactive Publication Date: 2007-01-17
3M INNOVATIVE PROPERTIES CO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, the complexity of such devices also leads to high cost

Method used

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  • Device and method for measuring the profile of a surface
  • Device and method for measuring the profile of a surface
  • Device and method for measuring the profile of a surface

Examples

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Embodiment Construction

[0014] Generally, the present invention relates to a device, referred to herein as a portable profilometer, which measures the profile of a non-moving surface by a non-contact method. In one embodiment, the profilometer comprises a beam supported on the surface to be measured by one or more beam supports. The sensor assembly arranged on the beam can move back and forth along the support track on the beam. The beam support allows the beam and sensor assembly to be arranged at a distance from the surface and generally parallel to the surface. During the movement of the sensor assembly back and forth along the beam, the sensor assembly provides the data acquisition device with information about the distance between the surface and the sensor assembly. At the same time, the position transducer provides the data acquisition device with information about the lateral distance of the sensor assembly along the support rail. As the sensor moves back and forth across the beam, an algor...

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Abstract

The invention provides a surface profile measurement device for use on rigid or semi-rigid substrates, such as floors. The device includes (a) a beam; (b) at least one beam support mounted on the beam; (c) a sensor assembly slidably connected to said beam and adapted for measuring the distance to the surface; and (d) a transducer assembly adapted for measuring the position of said sensor assembly along said beam.

Description

technical field [0001] The present invention relates generally to surface profilometers and, more particularly, to non-contact two-dimensional mapping devices for rigid or semi-rigid substrates such as floors and the like. Background technique [0002] The conversion of surface profile to quantifiable data is typically accomplished using a digital or analog device that has a component that measures linear position parallel to the surface and another component that measures relative distance perpendicular to the surface. In the simplest method, a straight edge linear measuring device such as a ruler or the like is placed on the surface and a second linear measuring device is used to determine the perpendicular distance from the straight edge to the surface. In most cases, the surface is in contact with the tip of the linear measuring device, which is arranged perpendicular to the general plane of the surface. Where the surface is a horizontal surface, the measuring device di...

Claims

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Application Information

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IPC IPC(8): G01B11/30
CPCG01B11/306Y10S33/21G01B11/30
Inventor 贾斯廷·W·威廉
Owner 3M INNOVATIVE PROPERTIES CO
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