Method for scattered radiation correction of a CT system
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- SIEMENS AG
- Publication Date
- 2007-05-02
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a method for radiation correction of a CT system with two focus / detector systems arranged at an angular offset to each other and operating simultaneously on a rotatable support, wherein for scanning an object, the The two angularly offset focal point / detector systems scan (abtasten) the object as follows: they rotate around the system axis of the CT system, and from the measured attenuation of the focal point radiation multiple absorption values for a single ray are determined , and carry out a scattered radiation correction to the measured values in order to reconstruct the CT picture and volume data of the object with the aid of the absorption data obtained. Background technique
[0002] A similar method is disclosed, for example, in patent document DE 102 32 429 B3. In this patent document, two focus / detector systems arranged at an angular offset to one another are operated at least temporally alternately, so that in ea...