Methods, Apparatus and Computer Program Products for Generating Selective Netlists that Include Interconnection Influences at Pre-Layout and Post-Layout Design Stages

Abstract

Operations for generating an integrated circuit netlist include generating a first schematic of an integrated circuit having a plurality of cells therein and generating a second schematic that defines pre-layout electrical interconnects between the plurality of cells of the integrated circuit and approximates parasitic resistances and parasitic capacitances of the pre-layout interconnects. The first and second schematics are then combined at corresponding first and second ports within the first and second schematics, respectively. Operations also include generating an integrated circuit netlist by generating a circuit schematic that defines post-layout electrical interconnects between the plurality of cells of the integrated circuit and approximates parasitic resistances and parasitic capacitances of the post-layout interconnects. This circuit schematic is then combined with the first schematic at corresponding first and second ports therein. These embodiments may also be configured to generate a layout schematic from the first schematic of the integrated circuit and generate parasitic resistances and capacitances of the post-layout interconnects that extend between a plurality of cells in the layout schematic. Operations are then performed to generate parasitic resistances and capacitances of interconnects internal to at least one cell in the layout schematic.

Description

REFERENCE TO PRIORITY APPLICATION [0001] This application is a divisional of U.S. application Ser. No. 10 / 629,154, filed Jul. 29, 2003, which claims priority to Korean Application No. 2002-76695, filed on Dec. 4, 2002. The disclosure of U.S. application Ser. No. 10 / 629,154 is hereby incorporated herein by reference.FIELD OF THE INVENTION [0002] The present invention relates to circuit design units, and more particularly, to devices for generating integrated circuit netlists that support device simulation. BACKGROUND OF THE INVENTION [0003] In general, the design of semiconductor integrated circuits follows a set method. To begin with, a schematic circuit, which is a diagram showing connections between circuit devices, can be designed by a schematic tool. Next, the respective circuit devices included in the schematic circuit can be designed by patterns of such material layers as a conductive layer, a semiconductor layer, and an insulation layer. Then, a layout is designed where the r...

AI Technical Summary

Benefits of technology

[0020] In some further embodiments of the present invention, cells and interconnections for analyzing specific operations can be selected in the simulation schematic circuit including the parasitic resistance and parasitic capacitance of the interconnections. Accordingly, various simulations can be analyzed quite accurately, and the time required for the simulation of a semiconductor integrated circuit can be effectively reduced. Also, in the selective netlist generation device and the method therefor according to the present invention, the parasitic RC interconnections generated in a pre-layout step or in a post-layout step are generated as the schematic circuit and then interfaced in a simulation device. As a result, as compared to the case that the netlist of the parasitic RC interconnection is interfaced as a file in the simulation device, errors caused by the designer can be reduced. Also, the present invention allows the designer to accurately analyze modeling of the parasitic resistance and parasitic capacitance. Further, it becomes easier for the designer to insert a variety of simulation options into the schematic circuit.

Problems solved by technology

Thus, the designer could model only a part of the parasitic resistance and the parasitic capacitance of the interconnection, which greatly affect the performance of the semiconductor integrated circuit.

As a result, the work of designing the parasitic resistance and parasitic capacitance of the interconnection increases design costs and design time.

Also, when a floor plan, which is schematic layout information of a semiconductor integrated circuit, was changed, it was difficult to change the parasitic resistance and parasitic capacitance of the interconnection.

Therefore, in the pre-layout stage, it was difficult to perform a simulation on the semiconductor integrated circuit, considering the parasitic resistance and parasitic capacitance of the interconnection.

Thus, when the semiconductor integrated circuit was simulated, errors such as a convergence error occurred often.

Also, a lot of problems were caused when a control card was input or a probe sentence was inserted for analysis of the simulation results.

Also, connections needed to be inconveniently tracked from the netlist having file formats other than the schematic circuit during the analysis of the simulation results.

But, as the netlist input to the simulation device has a particular file format, if a schematic circuit is changed, the foregoing simulation method using the layout design unit may become inconvenient.

Besides, the simulation method is applied to the full-chip of the semiconductor integrated circuit, and this may require a large simulation time.

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