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Microscope examination apparatus

a microscope and microscope technology, applied in the field of microscope examination apparatus, can solve the problems of high weight, inability to move at high speed, and difficult to make the microscope in document 1 track these pulse rates

Inactive Publication Date: 2007-08-02
OLYMPUS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0008] It is an object of the present invention to provide a microscope examination apparatus, a specimen securing method and securing apparatus, and a stage apparatus which can obtain clear images from a living organism that exhibits dynamic behavior and moves within a particularly short period of time.

Problems solved by technology

However, with the apparatus disclosed in Document 1, it is necessary to drive the entire microscope, which has a high weight.
Therefore, this apparatus has the problem that it cannot be moved at high speed.
For example, when observing a heart, because the pulse rate of a rat is about 350 beats per minute and the pulse rate of a mouse is about 620 beats per minute, it is extremely difficult to make the apparatus in Document 1 track these pulse rates.

Method used

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Examples

Experimental program
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first embodiment

[0069] A microscope examination apparatus 1 according to the present invention will be described below with reference to FIGS. 1 to 10.

[0070] As shown in FIG. 1, the microscope examination apparatus 1 according to this embodiment includes a stage 2 for mounting a specimen S; an excitation light source 3 for emitting excitation light E; an illumination lens (illumination optical system) 4 for guiding the excitation light E from the excitation light source 3; an objective lens 5 for guiding the excitation light E guided by the illumination lens 4 to the specimen S, as well as for collimating fluorescence F generated in the specimen S; a dichroic mirror 6 for splitting off from the excitation light E the fluorescence F collimated by the objective lens 5; a beamsplitter 7 for further dividing the split-off fluorescence F; and two image-acquisition devices (optical detectors) 8 and 9, such as CCDs, for detecting the split-off fluorescence F. Reference numerals 20 in this figure are image...

second embodiment

[0104] Next, regarding a microscope examination apparatus 40 according to the present invention, a blur-correction effect thereof and a method of correcting image blur will be described below with reference to FIGS. 19 to 22.

[0105] In the description of this embodiment, FIG. 19 is also used in the description of the microscope examination apparatus 1 according to the first embodiment described above. Also, parts having the same configuration as those in the first embodiment described above are assigned the same reference numerals, and a description thereof is thus omitted.

[0106] The microscope examination apparatus 40 according to this embodiment differs from the microscope examination apparatus 1 according to the first embodiment in that the objective lens 5 is rotated about an object-side focal point FOB thereof.

[0107] First, when the specimen S and the objective lens 5 are in the state shown in FIG. 19, an in-focus image of the specimen is projected over the entire plane of the...

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Abstract

The invention provides a microscope examination apparatus including a light source; an illumination optical system configured to guide light from the light source to a specimen; an objective lens configured to collimate return light from the specimen, the objective lens being provided in such a manner as to be displaceable at least in a direction intersecting an optical axis of the objective lens; an image-forming lens configured to image the return light from the specimen, which is collimated by the objective lens; an optical detector configured to detect the return light imaged by the image-forming lens; a microscope main body including the image-forming lens and the optical detector; and an objective-lens driving mechanism configured to drive the objective lens in a direction correcting image blur due to a displacement of the specimen.

Description

BACKGROUND OF THE INVENTION [0001] 1. Field of the Invention [0002] The present invention relates to a microscope examination apparatus, a method of securing a specimen, a securing apparatus, and a stage apparatus. [0003] This application is based on Japanese Patent Applications No. 2006-004881 and No. 2006-055060, the contents of which are incorporated herein by reference. [0004] 2. Description of Related Art [0005] Recently, in biological research, ion concentration, membrane potential, and so on have been visualized with fluorescence probes using optical microscopes. For example, using individual laboratory animals as specimens, so-called in vivo examination is carried out to observe internal organs and so on while the animal is still alive. In in vivo examination, however, because the examination site exhibits motion such as a pulse, respiration and so on, shifting of the examination site or defocus easily occurs. [0006] One known method of eliminating such shifting of the exami...

Claims

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Application Information

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IPC IPC(8): G02B21/00
CPCG02B21/24G02B27/646G02B21/26
Inventor FUKUYAMA, HIROYATANIKAWA, YOSHIHISAHIRATA, TADASHITAKAHASHI, SEIYA
Owner OLYMPUS CORP