Microscope examination apparatus
a microscope and microscope technology, applied in the field of microscope examination apparatus, can solve the problems of high weight, inability to move at high speed, and difficult to make the microscope in document 1 track these pulse rates
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first embodiment
[0069] A microscope examination apparatus 1 according to the present invention will be described below with reference to FIGS. 1 to 10.
[0070] As shown in FIG. 1, the microscope examination apparatus 1 according to this embodiment includes a stage 2 for mounting a specimen S; an excitation light source 3 for emitting excitation light E; an illumination lens (illumination optical system) 4 for guiding the excitation light E from the excitation light source 3; an objective lens 5 for guiding the excitation light E guided by the illumination lens 4 to the specimen S, as well as for collimating fluorescence F generated in the specimen S; a dichroic mirror 6 for splitting off from the excitation light E the fluorescence F collimated by the objective lens 5; a beamsplitter 7 for further dividing the split-off fluorescence F; and two image-acquisition devices (optical detectors) 8 and 9, such as CCDs, for detecting the split-off fluorescence F. Reference numerals 20 in this figure are image...
second embodiment
[0104] Next, regarding a microscope examination apparatus 40 according to the present invention, a blur-correction effect thereof and a method of correcting image blur will be described below with reference to FIGS. 19 to 22.
[0105] In the description of this embodiment, FIG. 19 is also used in the description of the microscope examination apparatus 1 according to the first embodiment described above. Also, parts having the same configuration as those in the first embodiment described above are assigned the same reference numerals, and a description thereof is thus omitted.
[0106] The microscope examination apparatus 40 according to this embodiment differs from the microscope examination apparatus 1 according to the first embodiment in that the objective lens 5 is rotated about an object-side focal point FOB thereof.
[0107] First, when the specimen S and the objective lens 5 are in the state shown in FIG. 19, an in-focus image of the specimen is projected over the entire plane of the...
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