Systems and methods for real-time monitoring of displays during inspection

Abstract

Described are techniques for maintaining reliable and reproducible conditions for panel inspection, i.e. pixel and line defect detection, while at the same time preventing large-scale panel damage. One implementation involves an apparatus for identifying a defect in an electronic circuit incorporating a circuit driving module configured to apply an electrical test signal to the electronic circuit; a defect detection module configured to identify the defect in the electronic circuit based at least on the applied electrical test signal; a signal monitoring module configured to measure the electrical test signal at the electronic circuit; and a control module operatively coupled to the signal monitoring module and the circuit driving module and configured to control at least the circuit driving module based on the electrical test signal measured at the electronic circuit.

Description

CROSS-REFERENCE TO RELATED PATENT APPLICATION[0001]The present U.S. patent application relies upon, claims the benefit of priority from, and is a non-provisional of U.S. provisional patent application No. 61 / 801,787 filed on Mar. 15, 2013, the entire disclosure of which is incorporated by reference herein.BACKGROUND OF THE INVENTION[0002]1. Field of the Invention[0003]The present invention relates generally to the field of electrical inspection of electronic devices and in particular to inspection of both rigid and flexible Liquid Crystal (LC) and Organic Light Emitting Diode (OLED) displays as well as the systems used in the inspection and defect detection.[0004]2. Description of the Related Art[0005]Liquid crystal display (LCD) panels incorporate liquid crystals that exhibit electric-field dependent light modulating properties. They are used most frequently to display images and other information in a variety of devices ranging from fax machines, cell phones, tablet and laptop com...

AI Technical Summary

Benefits of technology

The invention is about a method and apparatus for identifying defects in electronic circuits. The method involves applying an electrical test signal to the circuit, measuring the test signal at the circuit, and controlling the test signal based on the measured signal. This allows for more efficient and accurate detection of defects in electronic circuits. The apparatus includes a circuit driving module, a defect detection module, a signal monitoring module, and a control module. The control module can adjust various parameters of the circuit driving module to compensate for changes in the test signal or the condition of the circuit. The signal monitoring module can continuously measure the test signal and the control module can identify the defect based on the measured signal. Overall, the invention improves the efficiency and accuracy of identifying defects in electronic circuits.

Problems solved by technology

Nonetheless, some LCDs may have to be discarded because of manufacturing flaws in the assembled product.

However, because in accordance with the conventional inspection technology the driving voltages applied to the TFT panels under test during the inspection are not continuously monitored or controlled, any test pattern generator subsystem drift or changes in system or panel conditions can result in successive TFT panels being inspected under different conditions or unknowingly damaged during the inspection process.

By the time the issues are discovered in the cell process, many thousands of panels may have been damaged or inspected under less than optimum conditions, resulting in financial losses for the manufacturer.

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