Observing and controlling system for experimental apparatus

A technology of measurement and control system and testing machine, which is applied in the direction of digital control, electric controller, electric program control, etc., can solve the problems such as the inability to realize the mass production of the whole control system and the inability to effectively eliminate the surrounding environment, and achieves simple and reliable structure and improved performance. Effects of improved noise immunity and measurement accuracy

Inactive Publication Date: 2008-07-16
长春科新试验仪器有限公司
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Problems solved by technology

[0004] The invention provides a testing machine measurement and control system to solve the problem of the current testing machine measurement and control system relying on the discrete components of the resistance-capacitance circuit to adjust its magnification and item sensitivity and other parameters, which cannot effectively eliminate the surrounding environment and the discreteness of the analog components. The impact of precision, let alone the mass production of the entire control system, etc.

Method used

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  • Observing and controlling system for experimental apparatus
  • Observing and controlling system for experimental apparatus
  • Observing and controlling system for experimental apparatus

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Embodiment Construction

[0022] Data memory, program memory, calendar clock circuit, keyboard scanning circuit, liquid crystal display circuit and single-chip microcomputer are connected through the bus, wherein the bus includes data bus and address bus; the address latch is directly connected to the data port line of the single-chip microcomputer, using To latch the high 8-bit address; the serial port and the microcontroller are connected through a serial cable for level conversion; the analog-to-digital converter and the watchdog circuit can be directly connected to the I / O of the microcontroller for direct data transmission Transmission, the single-chip microcomputer drives the motor through the data bus, and the position feedback circuit is directly input to the interrupt port with the single-chip microcomputer.

[0023] The specific a) hardware circuit is:

[0024] 1. Data memory unit

[0025] The external data storage is mainly a cache for reading and writing hard disk data, so it must be non-v...

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Abstract

A tester control and detection system connecting monolithic computer (MC) by bus with data storage, program storage, calendar clock circuit, keyboard scanning circuit and liquid crystal display circuit is featured as connecting address locker directly to MC data interface, A / d converter watchdog circuit to MC I / O, position feedback circuit to MC interruption interface and using data bus to drive motor.

Description

technical field [0001] The invention belongs to the technical field of testing machine measurement and control. Background technique [0002] With the rapid development of digital technology, the testing machine industry has also moved from the previous analog control technology to digital control, but this so-called digital control technology can only use digital control in some unit circuits in the entire analog system. Still rely on the discrete components of the resistance-capacitance circuit to adjust its magnification and item sensitivity and other parameters. This method cannot effectively eliminate the impact of the surrounding environment and the discreteness of analog components on the accuracy of the entire system, let alone realize the mass production of the entire control system. This has brought a great impact on the electrical performance of the whole system and also brought a lot of troubles to production and maintenance. [0003] In China, the two technolog...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/18G05B19/19G05B19/414G05B11/42
Inventor 王振赵国峰
Owner 长春科新试验仪器有限公司
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