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Method for judging characteristic point place using Bayes network classification device image

A Bayesian network and feature point technology, used in instruments, character and pattern recognition, computer parts, etc., can solve the problem of inaccurate image discrimination, and achieve the effect of improved accuracy and high precision

Inactive Publication Date: 2008-09-03
SHANGHAI JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Aiming at defects such as the inaccuracy of image discrimination in the ASM method, the present invention proposes a method for using a Bayesian network classifier to discriminate the position of feature points in images, so that it converts the new position problem of image discrimination feature points into a method based on machine image discrimination. problem to solve, which can improve the accuracy of distinguishing feature points

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  • Method for judging characteristic point place using Bayes network classification device image
  • Method for judging characteristic point place using Bayes network classification device image
  • Method for judging characteristic point place using Bayes network classification device image

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Embodiment Construction

[0024] The technical solution of the present invention will be further described in detail below in conjunction with a specific embodiment.

[0025] The images used in the embodiment are from the face image library taken by Shanghai Jiaotong University. The whole implementation process is as follows:

[0026] 1. Select 600 face images marked with feature points from the face database to build an ASM model. A face image with marked feature points, such as figure 1 shown. That is, at first, 60 feature points are selected on each training sample image of the training set, and the shape formed by these 60 feature points can be composed of a vector x(i)=[x 1 , x 2 ,...,x 60 ,y 1 ,y 2 ,...,y 60 ] to indicate that the feature points with the same number represent the same feature in different images, 600 training sample images have 400 shape vectors, and then perform calibration operations on these 400 vectors to make the shape represented by these shape vectors closest in s...

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Abstract

The method includes following steps: (1) building ASM model; (2) using detecting human face and positioning eye initializes initial position of ASM search; (3) creating sample corresponding to each feature point on human face; (4) obtaining a Bayes network classifier by using corresponding sample for each feature point; (5) using initial position of ASM search as starting location, and using Bayes network classifier carries out positioning feature point. Being related to eye detection, training classifier, positioning feature point of ASM, the method for positioning feature points on human face is applicable to identifying faces, sexual distinction, determining emotional expression, and evaluating age with high precision.

Description

technical field [0001] The invention relates to a face feature point positioning method in the face recognition field, in particular to a method for discriminating feature point positions using a Bayesian network classifier image. Background technique [0002] Face recognition technology is the most practical technology in the core of many biometric features, including expression recognition, gender recognition, age estimation, pose estimation, etc., and face feature point positioning is the core technology in these research fields, and finally face recognition The accuracy of the method depends largely on the accuracy of facial feature point location. Therefore, accurately locating a large number of facial feature points can greatly improve the accuracy of face recognition. At present, the most practical face feature localization method is the global feature point localization method. Among these methods, the ASM (Active Shape Model) method can locate many face feature po...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/00
Inventor 杜春华杨杰张田昊陈鲁王华华吴证袁泉
Owner SHANGHAI JIAOTONG UNIV