Fluorescent x-ray analysis apparatus
An analysis device, X-ray technology, applied in measurement devices, analysis materials, material analysis using wave/particle radiation, etc., can solve problems such as increasing X-ray intensity, limited distance, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0065] Embodiments of the present invention will be described with reference to the drawings.
[0066] Figure 8 It is a block diagram of the fluorescent X-ray analysis apparatus of this invention. The X-ray source 1 is controlled by the control unit and the computer unit 82 to irradiate the sample container 8 with primary X-rays, and the X-ray detector 10 acquires secondary X-rays from the sample container 8 . The X-rays incident on the X-ray detector 10 are converted into electrical signals by the amplifier and waveform shaper unit 81 , converted into intensity spectra for each energy level by the control unit and computer unit 82 , and displayed on the monitor 83 . In addition, the control unit and the computer unit 82 also perform density calculation based on the spectral information, and display the information on the monitor 83 .
[0067] figure 1 It is a schematic diagram of the X-ray optical system of the fluorescent X-ray analysis apparatus of this invention. exi...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com