X-ray fluorescence (xrf) spectroscopy systems and methods
A spectral analysis and X-ray technology, which is applied to the use of wave/particle radiation for material analysis, analysis of materials, instruments, etc., can solve the problems of insufficient detection sensitivity, unsuitable analysis of light elements, low detection limit, etc., to improve effective detection The effect of improving efficiency, improving detection sensitivity, and reducing detection limit
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[0018] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0019] The primary X-ray emitted from the X-ray source contains the characteristic X-rays (discrete) and bremsstrahlung (continuous spectrum) of the target, and the primary stage emitted by the X-ray source is controlled by a crystal grating (or diffractive optical component (3)) X-rays with specific energy in X-rays are diffracted to obtain single-wavelength X-rays to excite the tested sample. On the one hand, the excitation efficiency can be improved, and the scattering background can be reduced at the same time. Moreover, the single-wavelength X-rays obtained by diffracting the circularly polarized primary X-rays through crystals are either linearly polarized or elliptically polarized, depending on the incident angle and the geometric structure ...
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