Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Anti-Compton Scattering Detector

An anti-Compton and detector technology, applied in radiation measurement, X-ray energy spectrum distribution measurement, X/γ/cosmic radiation measurement, etc., can solve the problems of harsh working temperature and non-portability of the main detector , to achieve the effects of reducing detectable activity, saving practical costs, and realizing miniaturization

Inactive Publication Date: 2017-05-24
CHENGDU UNIVERSITY OF TECHNOLOGY
View PDF12 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The existing multi-probe combination detectors are in the form of array combination, while the form of nested combination of main and auxiliary detectors is relatively rare. Most of the existing nested combination detectors use high-purity germanium or lanthanum bromide semiconductor as the main detector. The scintillator detector used in the outer layer is used as an auxiliary detector. Since the working temperature (-188℃~-163℃) of the main detector in this combination is relatively strict, it is necessary to add a large volume and power refrigeration (such as electric refrigeration, mechanical Refrigeration, liquid nitrogen refrigeration, etc.) devices, so this type of design is mainly for laboratory analysis, not portable

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Anti-Compton Scattering Detector
  • Anti-Compton Scattering Detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The structure of the anti-Compton scattering detector is as follows figure 1 As shown, it includes a main detector 6 made of sodium iodide material, the lower end of the main detector 6 is connected to a photomultiplier tube 1, and the main detector 6 is nested into a plastic scintillator to make a synthetic "well" type auxiliary detector 3, figure 1 It is a cross-sectional view of the detector. The main detector 6 is cylindrical and embedded in the auxiliary detector 3, so the auxiliary detector is a well type. There is a photoconductive material 4 between the main detector 6 and the auxiliary detector 3, and the upper end of the auxiliary detector 3 Connect the photomultiplier tube 1, the lower end of the auxiliary detector 3 is a lead shielding ring 5, the outer layer of the main detector 6 and the auxiliary detector 3 is packaged with a metal shell 2 coated with a magnesium oxide reflective layer.

[0020] In order to extract the γ-rays produced by the low-count tar...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an anti-Compton scattering detector, which comprises a main detector made of the sodium iodide material. The lower end of the main detector is connected with a photomultiplier. The main detector is nested into an auxiliary detector compounded of a plastic scintillator. The light guide material is arranged between the main detector and the auxiliary detector. The upper end of the auxiliary detector is connected with the photomultiplier. The lower end of the auxiliary detector is provided with a lead shielding ring. According to the invention, the background influence of natural gamma-ray scattered photons (Compton effect) is reduced to the maximum extent. Meanwhile, the accuracy of the in-situ environment gamma-ray detection result is improved. The structure unit of the detector is simplified and the power consumption of a complete machine is lowered.

Description

technical field [0001] The invention belongs to the technical field of radiation detection equipment, and relates to an anti-Compton scattering detector. Background technique [0002] For a long time, the technology of "low-level radioactivity detection under high background conditions" has been concerned by scholars at home and abroad (H.Oeschger, 1975; Kenichi Nogami, 1978; Theórsson P.1991; Zheng Renqi, 1985, 1995; Li Deping, 1994; Huang Naiming, 2004 ;Wait). Many scholars have done a lot of work on this problem from theoretical method research to measurement system development and application. The traditional low-level environmental radioactivity monitoring method is "on-site sampling-laboratory analysis" (also the main method currently used in China), and the degree of on-site analysis technology is not high (Sha Lianmao, 2011), with poor timeliness and a lot of equipment used It is a large analytical instrument in the laboratory, which is not easy to carry and the an...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01T1/36
CPCG01T1/361
Inventor 赵剑锟葛良全罗耀耀张庆贤谷懿杨海程鹏亮
Owner CHENGDU UNIVERSITY OF TECHNOLOGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com