IC detecting machine capable of simultaneously multiple parallel built-in testing

A detection machine and insertion technology, which is applied in the direction of electronic circuit testing, electrical measuring instrument parts, measuring electricity, etc., can solve the problems of limited production capacity, multi-exchange displacement time, and multi-time, so as to reduce IC exchange pick-and-place The effect of shifting time, reducing standby time, and increasing productivity
CN101082631AActive Publication Date: 2007-12-05HON TECH INC
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
HON TECH INC
Publication Date
2007-12-05

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Abstract

The invention discloses an IC feeler mechanism to do multiple paralleling particle placements simultaneously, which comprises the following parts: material supplying box, material-receiving box, input end IC transmitting mechanism, output end IC transmitting mechanism, testing part, transmitting tool and orbit transmitting mechanism, wherein the input end IC transmitting mechanism sucks the detected IC on the material supplying box to the transmitting tool to bear multiple particles of the detected IC; the transmitting tool utilizes orbit transmitting mechanism to transmit the transmitting tool into the testing part through orbit, which testes multiple particles of IC to move out the transmitting tool after testing; the output end IC transmitting mechanism classifies each tested IC in the transmitting tool to place in each receiving box. The invention reduces the exchanging, placing and depositing time of IC greatly, which improves the testing property effectively.
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Description

technical field

[0001] The invention relates to an IC testing machine, in particular to an IC testing machine which can simultaneously transfer multiple ICs to a test port for testing by using a carrying jig and can simultaneously insert and test multiple ICs in parallel. Background technique

[0002] Under the continuous research and development and innovation of today's technology, the work that must be completed by the combination of many large electronic circuits in the past has been completely replaced by integrated circuits (IC for short). Since ICs undergo multiple processing procedures in the production process, Therefore, in order to ensure product quality, after the IC production is completed, the merchants will carry out circuit testing operations to detect whether the IC is damaged during the production process, and then detect defective products.

[0003] Please refer to Fig. 1, which is the applicant's previous Taiwan Patent Application No. 91210786 "Conveying ...

Claims

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