10results about How to "Improve test throughput" patented technology

The invention discloses an analog integrated circuit test method based on edge calculation, the method is executed by an edge node, and the method comprises the following steps: obtaining a step response waveform of an analog integrated circuit; extracting screening features from the step response waveform; determining an abnormal level and a test type of the screening feature; determining the demand level of the server for the original waveform data based on the abnormal level of the screening feature and the test type; and determining a sending strategy for sending the screening feature and the original waveform data to the server based on the demand level. According to the invention, waiting and repeated interaction of the server can be reduced, and test judgment efficiency and test throughput are improved.

The present application provides a test machine, which comprises a test device, a conveying device, a feeding device, a collecting device, a moving device and a central control device. A plurality of test chambers of the test device are configured with testers for testing electronic components. A moving frame of the conveying device can carry the feeding device, the collecting device and the moving device to move synchronously to one side of the test device along a conveying path. The moving device has a mover which can move independently in a plurality of directions to facilitate rapid movement of the electronic components to be tested or tested among the feeding device, the collecting device and the test device. Thus, the moving distance of the feeding and collecting devices is effectively reduced, and the moving device is lightweight and can move rapidly to pick and place the components, thereby improving the test capacity.

The utility model relates to electrical measurement and automation test technical field, concretely relates to a kind of AC-DC withstand voltage insulation tester, it includes: main control unit, for executing test program and controlling each module coordinated work;High voltage output module, for generating the AC / DC high voltage required by test;Precise current detection module, for detecting the leakage current of measured piece;Multi-channel test interface, for connecting multiple measured equipment;Automatic switching unit, for automatically switching test channel;Data storage module, for automatically recording test data;Man-machine interface, for displaying test information and receiving operation instruction.The utility model is jointly constituted by innovative design an advanced test system with automation, high precision, high efficiency, intelligent management in one, realizes qualitative leap in test quality, operation convenience, production efficiency and safety etc., fully meets the rigorous requirement of modern industry to electrical safety test equipment.

The invention provides a fault injection parameter processing method and device based on a test process context, and the method comprises the steps: obtaining process context information containing a multi-step logic relation through analyzing a test process described by an ATML (Automatic Test Markup Language); according to the process context information and the real-time resource state of the current test system, collaborative analysis and dynamic decision making are carried out, and adaptive fault injection parameters are intelligently generated; and finally executing fault injection according to the generated parameters. According to the method, the defects of fixed fault parameters and lack of process adaptability in a comprehensive test in the prior art are overcome, the conversion from static parameter table lookup to dynamic context sensing decision is realized, and the automation level, test precision and adaptability to complex test scenes of aviation tests and tests are remarkably improved.

The invention discloses an automatic test system and method based on a relay protection device, and relates to the technical field of relay protection device analysis. In the relay protection test process, electrical time sequence data and device state signals in the test stage are collected in real time, data are processed, and a scene data unit capable of being independently stored and analyzed is generated; constructing a test path transfer directed graph; predicting a subsequent stage candidate set according to the test path transfer directed graph; forming a to-be-executed candidate list according to the predicted subsequent stage candidate set in combination with the current available resource set; analyzing a resource conflict relationship among the test items, and generating an optimized test sequence; when it is detected that the test process is abnormally interrupted, a continuous test execution instruction is generated by conducting mode matching on the context and a historical successful continuous test case, the test is recovered from the breakpoint, and meanwhile the interruption and recovery mode is stored in a historical continuous test case library. And the success rate and the safety of continuous testing are improved.

The application discloses a temperature control jig, which comprises a top plate, an intermediate layer and a bottom plate arranged in layers, wherein the top plate and the bottom plate are flat plate structures, a frame is arranged along the edge of the top plate, one side surface of the frame protrudes from the surface of the top plate, the top plate and the frame form a containing space for containing a display panel to be tested, a plurality of heat conduction columns are arranged on the side surface of the bottom plate away from the intermediate layer, and the intermediate layer is provided with a plurality of arrayed through holes, so that the cross section of the intermediate layer is a grid structure. The grid design of the intermediate layer of the temperature control jig greatly reduces the overall mass and heat capacity of the jig, so that heat can be more quickly conducted to the top plate through the bottom plate heat conduction columns, and the temperature rising and falling waiting time is shortened. Moreover, when the grid structure is heated and expanded, the through holes provide internal deformation space, effectively avoiding macro warping of the jig as a whole, and ensuring flat and close fitting of the panel and the jig during the test.

The utility model discloses a nitrogen spring elastic force testing device with a continuous detection function, which comprises a bottom plate, a servo motor is arranged on one side above the bottom plate, and a base is arranged above the bottom plate. The reciprocating lead screw is driven by the servo motor, so that the sliding sleeve can accurately move on the reciprocating lead screw, the whole testing mechanism is further driven to move in the horizontal direction, the testing mechanism is allowed to be rapidly switched between the two bases through the design, manual movement or equipment readjustment is not needed, the standby time is remarkably shortened, and the testing efficiency is improved. Due to the fact that the testing mechanism can freely move between the two bases, after the nitrogen spring on one base is tested, the nitrogen spring can be immediately moved to the other base to conduct the next group of tests, the continuous testing function greatly improves the testing efficiency, and especially in large-scale production or quality detection, the testing efficiency is greatly improved. And a large number of nitrogen spring testing tasks can be completed more quickly.

The invention provides a test fixture for testing an image sensor chip, and aims to solve the problems of poor imaging consistency, limited site layout and the like caused by stray light generated by reflection and refraction of light on the surface of a structural member in an existing structure. The through straight hole is formed in the structure between the light source and the lens, and the transparent light guide piece is embedded in the straight hole, so that illumination light is transmitted in a unique and stable path. The material and the shape of the light guide piece can be freely selected according to requirements so as to adapt to different spectral characteristics and light source positions. The light enters the dodging part and the lens system after being directionally transmitted by the light guide part, and the middle does not contact the surface of a surrounding structure, so that stray light is effectively prevented from being generated, and the illumination uniformity and imaging consistency of each test position are remarkably improved. Due to the fact that the light path is strictly limited, the scheme is not limited by the field angle of the lens any more, the site distance can be reduced, a plurality of test positions can be flexibly arranged, the number of testable points in unit area is increased, and therefore the test efficiency and the throughput capacity of a production line are improved. The probe card is simple in structure, convenient to process and high in adaptability, can be directly applied to an existing probe card system, and has good popularization value.

The application belongs to the technical field of multi-channel storage card testing, and specifically discloses a multi-channel storage card parallel testing system and method based on FPGA, which comprises a master control processor configured to receive a testing firmware instruction and issue the testing firmware instruction to a central decoding and distribution module; the central decoding and distribution module is configured to communicate with the master control processor, receive the testing instruction issued by the master control processor and decode the testing instruction, generate a command frame and a channel enable mask, and issue the command frame and the channel enable mask to each controller; a plurality of controllers, each of which is connected to a storage card, and each of which is configured to judge whether the controller is enabled based on the received command frame and the channel enable mask, and if the controller is enabled, send a command to the storage card through a physical pin and receive a response of the storage card; the application significantly improves the overall testing throughput and avoids resource redundancy caused by simply copying multiple independent testing units.

This invention discloses an AI-based automated integrated testing system for optical module firmware verification, belonging to the field of optical communication equipment testing technology. Specific features include: deploying a three-sensor matrix of optical, electrical, and environmental sensors to synchronously collect core parameters of the optical module; setting an appropriate sampling frequency to ensure complete capture of transient fluctuations and timestamp synchronization; employing a dynamic threshold method based on temperature change rate to eliminate outliers; extracting three basic features: temporal coupling, frequency domain correlation, and spatial distribution; combining fault sensitivity coefficients and feature redundancy with weighted fusion to form comprehensive features; constructing a multi-stage fusion diagnostic system; dynamically switching and adapting sub-models; accurately identifying various faults and associating them with environmental parameters to locate the causes; the system supports incremental updates of model parameters and core parameter threshold libraries; and automatically generates standardized test reports containing feature correlation maps and parameter change curves, significantly improving the efficiency, accuracy, and intelligence level of optical module firmware verification.