Turnover testing module and testing system thereof

A test module and test system technology, which is applied to the testing of machine/structural components, measuring devices, instruments, etc., and can solve the problems of general products without suitable structure and inconvenience.

Active Publication Date: 2010-09-29
KING YUAN ELECTRONICS
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] This shows that above-mentioned existing test system obviously still has inconvenience and defect in structure and use, and urgently needs to be further improved
In order to solve the above-mentioned problems, the relevant manufacturers h

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Turnover testing module and testing system thereof
  • Turnover testing module and testing system thereof
  • Turnover testing module and testing system thereof

Examples

Experimental program
Comparison scheme
Effect test

Example Embodiment

[0052] In order to further explain the technical means and effects of the present invention to achieve the intended purpose of the invention, the specific implementation, structure, and features of the flip test module and its test system proposed in accordance with the present invention will be given below with reference to the accompanying drawings and preferred embodiments. And its effects are described in detail later.

[0053] The aforementioned and other technical content, features and effects of the present invention will be clearly presented in the following detailed description of the preferred embodiment with reference to the drawings. For ease of description, in the following embodiments, the same elements are denoted by the same numbers.

[0054] figure 1 The system block diagram of shows the flip test system 1 of the embodiment of the present invention, which is used to test the flip motion of the packaged motion sensor (motion sensor, or dynamic sensor). A motion sen...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a turnover testing module and a testing system thereof. The turnover testing module comprises at least one accommodating device such as a slot used for temporarily accommodating a tested assembly and also comprises a turnover mechanism used for turning over one or more axial turnovers. The turnover testing module combines a handler and a tester to form a turnover testing system, wherein the handler is used for picking up and placing the tested assembly to the turnover testing module, and the tester is used for respectively controlling the turnover testing module and the handler. Via the modularized design, the turnover testing module can be integrated into a traditional testing system and can be elastically replaced with other motion testing modules. The inventionnot only can reduce the cost and simplify the design, but also can increase the testing elasticity and the diversity so as to be beneficial to improving the testing capacity.

Description

technical field [0001] The invention relates to a test system, in particular to a flip test module suitable for a motion sensor (motion sensor) and a test system thereof. Background technique [0002] A motion sensor (or dynamic sensor) is a component that can convert a motion state (such as a tilt angle) into a corresponding electronic signal, which is gradually widely used in modern electronic or electromechanical devices, such as game controllers, Mobile phones, digital music players (MP3), cameras, personal digital assistants (PDAs) that implement various motion (e.g. flip, acceleration, rotation, etc.) related applications to promote authenticity, convenience or functionality in use diversity. [0003] Today's motion sensors are generally manufactured as integrated circuits by combining semiconductor process technology with electromechanical technology (such as micro-electro-mechanical system (MEMS) technology). Like a general integrated circuit, a final test (final t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01M19/00G01D5/12G01M99/00
Inventor 倪建青徐培伦赖茂德
Owner KING YUAN ELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap