Fuse wire circuit

Abstract

The present invention is a fusible wire circuit, comprising at least one fusible wire circuit element and a current blocking module unit. The fusible wire circuit element comprises a voltage building module unit which is connected with a voltage reference source 1. The voltage building module unit comprises a fusible wire, and one end of the fusible wire is connected with a node and is used for selectively blowing according to a primary set signal. Wherein, the voltage building module unit builds a voltage potential at the node according to the blowing state of the fusible wire. The present invention also comprises a latch which is connected with the voltage building module unit through the node and is used for latching the voltage potential which is corresponding to the node so as to produce output signal. The current blocking module unit is connected between a voltage reference source 2 and the other end of the fusible wire, and is used for blocking the current flowing through the fusible wire when setting the primary signal.

Description

technical field [0001] The invention relates to a fuse circuit, in particular to a fuse circuit with low power loss. Background technique [0002] see figure 1 , figure 1 It is a schematic diagram of a general fuse circuit (Fuse Circuit) 100 . Such as figure 1 As shown, the fuse circuit 100 includes a voltage building module 110 and a latch 120 . The voltage establishing module 110 is used to establish a voltage potential on the node A according to the blown state of the fuse I1; and the latch 120 then performs latch processing on the voltage potential established on the node A to generate a voltage potential output signal. [0003] Generally, the fusing state of the fuse I1 is determined during the initial setting of the fuse circuit 100. In other words, the user can decide whether to blow the fuse I1 during the initial setting, so as to The fuse circuit 100 is made to have different outputs. [0004] The initial setting signal PU input to the transistor P3 of the vo...

AI Technical Summary

Problems solved by technology

[0009] However, another problem arises from the structure of the fuse circuit 200. Since generally the fuse circuit 200 is built in a relatively large number in an integrated circuit (for example, built in a DRAM), each fuse circuit For the fuse circuit 200, an additional transistor N2 must be provided, which undoubtedly costs more manufacturing costs; in addition, the fuse circuit 200 still does not propose a good solution to the problem of leakage current passing through the incompletely blown fuse I1 and transistor P2. solution

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