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Method, device and collecting terminal for measuring availability

A technology of faults and equipment, applied in the field of detection, can solve the problems of large influence, inaccurate recorded time, and hysteresis, and achieve the effect of avoiding the influence of external factors, recording data objectively, and accurate availability

Inactive Publication Date: 2012-04-25
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] However, the existing technology is greatly affected by external factors due to manual recording of time.
Because changes in the operating status of equipment, such as failure or recovery, are usually not immediately perceived by humans, and there is a certain lag. In addition, there may be some factors such as human negligence or force majeure, which makes the recorded time inaccurate. MTBF and MTTR are also inaccurate, so the calculated availability is inaccurate and cannot truly reflect the state of the equipment

Method used

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  • Method, device and collecting terminal for measuring availability
  • Method, device and collecting terminal for measuring availability
  • Method, device and collecting terminal for measuring availability

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Embodiment Construction

[0036] The present invention provides a method for measuring availability, the core idea of ​​which is: when the equipment undergoes a state transition between the working state and the fault state, the equipment records the state transition time and transformation attributes, and calculates the average value of the equipment according to the recorded information The time between failures and the mean time to repair failures are used to calculate the availability.

[0037] In the present invention, the so-called working state and fault state can also be called used state and idle state. The used state of the device refers to the state in which the device is running normally and can be used normally; the idle state of the device refers to the state in which the device fails and cannot be used normally. When considering the modules in the device, the present invention also divides the module states into a used state and an idle state. The used state of the module refers to the ...

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Abstract

The invention discloses a method for measuring availability. The method is that when the status of equipment changes from working status to failure status, the equipment records the changing time and changing property during, and calculates the average fault interval and the mean time to repair and thereby obtains the availability via calculation. Correspondingly, the invention discloses a measuring availability device and collecting end. The invention can obtain more accurate availability of the equipment and can reflect the equipment status in a more real way.

Description

technical field [0001] The invention relates to the technical field of detection, in particular to a method, a device and a collection terminal for measuring availability. Background technique [0002] Availability is an index to measure the reliability, maintainability and supportability of equipment. It is defined in the national standard GJB451-1990 "Terms of Reliability and Maintainability" as: under specified conditions, when the task requires, the equipment is ready for use. state probability. The calculation formula of availability Ai is as follows: [0003] Ai=MTBF / (MTBF+MTTR) [0004] MTBF (mean time between failure) refers to the mean time between failures, which is usually used as an indicator to measure the reliability of equipment; MTTR (mean time to repair) refers to the mean time to repair, usually used as a measure of the maintainability of equipment index. [0005] It can be seen that if you want to obtain the availability of a single device, you must kn...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L12/26G01M99/00
Inventor 李夫兵
Owner HUAWEI TECH CO LTD
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