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Device and method for analyzing a solid, elongate test material

A technology of articles and equipment, which is applied in the field of equipment and methods for inspecting solid and slender objects under test, can solve problems such as uneven electric field, more space occupied by the measuring end, and failure to achieve the expected protection effect of the protective electrode. The effect of small build shapes

Inactive Publication Date: 2008-04-23
USTER TECHNOLOGIES
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, optical devices have the disadvantage that they cannot identify transparent impurities, that is, impurities that are the same color as the item under test, or that are hidden inside the item under test and cannot be seen from the outside
However, since the electric field at the edge of the measuring local electrode will become non-uniform as a result, the desired protective effect of the guard electrode cannot be achieved
Also, as the electrodes become larger in this way, the measuring tip takes up more space, which is not conducive to practical applications

Method used

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  • Device and method for analyzing a solid, elongate test material
  • Device and method for analyzing a solid, elongate test material

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Embodiment Construction

[0019] Fig. 1 is a perspective view of the first embodiment of the measuring terminal 1 in the device of the present invention. The measuring terminal 1 must include a measuring capacitor 2. Moreover, in this embodiment, the measurement capacitor 2 is a double plate capacitor, which includes a first plate capacitor plate 21 and a second plate capacitor plate 22. The capacitor plates 21 and 22 each have a thickness of about 0.8 mm, are made of brass, etc., and can be coated with nickel in order to achieve higher abrasion resistance. The two capacitor plates 21 and 22 are separated from each other by about 1-3 mm, preferably, they are separated by an air gap of 1.5-2.0 mm thick, so as to form a passage 26 for a solid, elongated object 9 to be tested. The object 9 to be tested may be yarn or the like. The tested article 9 passes through the passage 26 along the longitudinal direction x, and is therefore subjected to the alternating electric field 29 generated between the two capacito...

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PUM

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Abstract

Disclosed is a device for analyzing a solid, elongate test material (9). Said device comprises a precision capacitor (2) with a test part electrode (23) and protective electrodes (24.1, 24.2) which are electrically insulated therefrom. The inventive device further comprises means (4) for applying an alternating current to the precision capacitor (2) in order to generate an alternating electrical field in the precision capacitor (2). The protective electrodes (24.1, 24.2) are designed for active guarding by being maintained on the same potential regarding the alternating voltage as the test part electrode (23). The active guarding process allows test materials (9) having different thicknesses to be analyzed using one and the same test head (1). Signal noise is reduced, the output signal is largely independent of the position of the test material (9) in the transversal direction, and the test head (1) has small geometrical dimensions.

Description

Invention field [0001] The invention relates to the field of testing solid and slender textiles such as slivers, rovings, yarns or fabrics using capacitor devices. According to the description in the independent claims, the present invention particularly relates to a device and method for inspecting solid, elongated objects to be tested. The purpose of this inspection is as follows: to detect impurities or to identify changes in mass per unit length. Background technique [0002] In the textile industry, it is required to be able to reliably identify impurities such as polypropylene in slender textiles such as yarns. Optical devices are generally used for this purpose. However, the optical device has the following shortcomings: it cannot identify transparent impurities, that is, impurities that have the same color as the object under test, or are hidden inside the object under test and cannot be seen from the outside. [0003] By using electrical devices, especially capacitive de...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/24
CPCG01N27/24G01N33/365G01N27/226
Inventor P·奥特P·施密特
Owner USTER TECHNOLOGIES