Establishment method of control specification limit
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- POWERCHIP SEMICON CORP
- Publication Date
- 2008-05-07
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a method applied to statistical process control, in particular to a method for formulating control specification limits applied to statistical process control. Background technique
[0002] Statistical Quality Control (SQC) is a technology to maintain and improve product quality, and Statistical Process Control (SPC) is one of the main tools, which focuses on the analysis of data in the manufacturing process , to determine the cause of product variation. Therefore, statistical quality management consists of two main parts, statistical process control and sampling acceptance criteria. Statistical process control (SPC) is the use of process operating variables to predictively monitor production variables or product quality variables. Therefore, the use of statistical process control can be said to start from detecting process abnormalities, accurately grasping the process status, avoiding abnormal occurrences, and the ultimate ...