8 results about "Statistical quality" patented technology

The invention provides a high-throughput random number generation method and generator based on a quantum entanglement source, and relates to the field of quantum computation.The high-throughput random number generation method comprises the following core steps that firstly, in the entanglement debiasing process, a quantum sequence entangled with a random seed is constructed through inference, complete extension mapping of an anti-correlation entanglement quantum sequence is achieved, and the quantum sequence is generated; and generating a random bit sequence with doubled length and unbiased statistics. Secondly, in the full-permutation expansion process, the inter-domain correlation of the full-permutation sequence is eliminated through a shuffling method while sequence length exponential growth is achieved; and thirdly, in the layered asynchronous arrangement process, the intra-domain correlation is further eliminated through two-layer segmentation, asynchronous arrangement and shuffling processing, and finally a random bit sequence which meets the statistical quality requirement and has the length. According to the method, through removal of intra-domain and inter-domain correlation, the unpredictability of output random numbers is remarkably enhanced; and exponential-level high-throughput output is realized while the output random number is ensured to pass through all test items of the NIST SP 800-22.

In a single-wafer heat treatment furnace, the lift speed is appropriately controlled to perform heat treatment on semiconductor wafers, taking into consideration both quality standards and productivity. [Solution] The method for manufacturing a heat-treated semiconductor wafer involves creating a database of relationships between one or more statistical quality parameters selected from the group consisting of flatness, light point defect, lift pin mark area, and lift pin mark height, and lift operation parameters; calculating process capability parameters for lift operation parameter combinations based on the standard information of one or more quality parameters selected from the group and the database; determining whether multiple lift operation parameter combinations pass or fail based on the calculation results; selecting lift operation parameter combinations from among those determined to pass, selecting lift operation parameter combinations whose total lift operation time is less than or equal to a threshold; setting the lift speed in a single-wafer heat treatment furnace with variable settings; and heat-treating the semiconductor wafer in the furnace.

The invention provides a method and system for determining a steel product quality defect generation process, and relates to the technical field of quality management, and the method comprises the following steps: presetting a corresponding relation between a defect account-returning code and a steel product quality defect in an ERP system; the defect account-returning code comprises a defect generation process and a defect account-returning process, when defects are generated in the steel product production process, an operator in the current process takes the current production process as a preliminary defect account-returning code of the defects and records the preliminary defect account-returning code in an ERP system; if the current process operator judges that the defect is not generated in the current process, a target generation process of the defect is judged, an operator of the target generation process is notified to determine the generation process of the defect on site within 48 hours, and the generation process serves as a final defect account-returning code of the defect to replace the initial defect account-returning code and is recorded in the ERP system; when the quality indexes are counted, the defect account-returning codes in the ERP system are counted in a classified mode according to the working procedures, and the actual quality control level of each working procedure is represented.

This disclosure describes techniques for analyzing statistical quality of bitstrings produced by a physical unclonable function (PUF). The PUF leverages resistance variations in the power grid wires of an integrated circuit. Temperature and voltage stability of the bitstrings are analyzed. The disclosure also describes converting a voltage drop into a digital code, wherein the conversion is resilient to simple and differential side-channel attacks.

To facilitate data analysis in a lot unit regarding kneading of a rubber material.SOLUTION: Data analysis device 1 comprises: a learning data acquisition unit 701 that acquires lot-unit process data and lot-unit quality data; a learning statistical process data generation unit 702 that generates multiple batch-unit statistical process data based on each of the multiple batch-unit process data included in the lot-unit process data, and generates lot-unit statistical process data based on the multiple batch-unit statistical process data; a learning statistical quality data generation unit 703 that generates lot-unit statistical quality data based on the multiple batch-unit quality data; a learning data generation unit 704 that generates learning data including the lot-unit statistical process data and the lot-unit statistical quality data; and a learning unit 705 that performs learning of a machine learning model 706 based on the learning data.SELECTED DRAWING: Figure 9

The invention relates to the technical field of data processing, in particular to a precision data batch statistics method based on data processing, and the method comprises the steps: obtaining a precision data set to be subjected to batch statistics; constructing a normal distribution curve of the precision data set according to the data mean value and the data standard deviation of the precision data set, and performing rough analysis of normal distribution characteristics on the normal distribution curve to obtain a first normal similarity; if the first normal similarity is smaller than a preset coarse similarity threshold value, performing data conversion on the precision data set to obtain an optimal conversion data set; constructing a target normal distribution curve of the optimal conversion data set, performing fine analysis of normal distribution characteristics on the target normal distribution curve to obtain a second normal similarity, adaptively obtaining an optimal batch statistics mode according to the second normal similarity, performing batch statistics on the optimal conversion data set, and obtaining a batch statistics result. The batch statistical quality of the polarization precision data is remarkably improved, and a more reliable basis is provided for decision making.

The application provides a method for engineering quantity statistics, which comprises the following steps: setting a unique identifier for each item information according to the corresponding relationship between the engineering code and the item information; generating an item list according to the corresponding relationship among the engineering code, the item information and the unique identifier; determining the unique identifier corresponding to each item information of each component in a component model and the corresponding engineering quantity according to the item list; generating an engineering quantity configuration table according to the item information and the corresponding engineering quantity of all components in the component model; selecting the required item information from the item list, and selecting the engineering quantity of each item information of at least one component from the engineering quantity configuration table according to the selected item information. The application can make the engineering quantity statistics more convenient and fast, and improve the statistical quality and work efficiency.