The application provides a UART
chip testing method and
system, and belongs to the field of
integrated circuit testing. In the testing of the UART
chip, the time from receiving the instruction at the RX to returning the data to the testing
machine at the TX port is uncertain, which causes the testing
machine to be unable to determine when the TX port starts to transmit the data. The application does not need the testing
machine to configure the
Match function, and saves the collected data in the releasable variable space of the host computer, processes the collected data, obtains the output character, and compares the output character with the expected character, so that the writing and use of the output expected result pattern are saved, and the
space use of the testing machine LVM is reduced. Meanwhile, the collected data is converted into characters through
processing, which facilitates the engineers to determine the reason for the
chip testing failure. The testing method does not need special testing board design, and can perform parallel testing of the UART protocol of multiple sites.