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Method for testing memory in embedded system

A technology for embedded systems and memory testing, applied in the direction of detecting faulty computer hardware, etc., can solve problems such as the purchase and management costs of hardware tools, and achieve the effect of simplifying hardware design and hardware costs

Inactive Publication Date: 2008-07-02
MAIPU COMM TECH CO LTD
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  • Abstract
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AI Technical Summary

Problems solved by technology

At present, the more popular method is to test the memory of the embedded system through the test equipment. Due to the increase of hardware tools, it brings unnecessary hardware tool purchase and management costs.

Method used

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  • Method for testing memory in embedded system

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Embodiment Construction

[0012] The general boot sequence of an embedded system: the system is powered on, the processor executes the basic hardware initialization program in the ROM, jumps to the memory to run, loads the application program and initializes the application program, and the system starts successfully. When the embedded system runs the basic hardware initialization program in ROM, it is the best time to test the memory. At this time, the memory can be fully tested. Otherwise, once the processor enters the memory to run the program, the memory cannot be fully tested. up.

[0013] In the present invention, after the system is started, the user interface is entered. If the memory needs to be tested, the memory test command is input to complete the setting of the memory test flag in the parameter register of the processor. After the test command is executed, the system performs a memory test with a flag The value of is recorded in the parameter register, such as using v0 as the memory test ...

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Abstract

The invention relates to a memory testing technology in embedded system technology equipment test and aims to solve the technical problems that: a method for controlling memory testing by software and roundly testing the memory is provided so as to lower the test cost. The invention has the technical proposal of the method for testing the memory in the embedded system. The method has the steps as follow: (1) a memory testing mark is arranged in a parameter register; (2) when a processor runs a basic hardware initializing program in a ROM, whether the memory testing mart is existed is judged; the step (3) is entered if the memory testing mart is existed, and the processor jumps into the memory to run a system initializing program if not; (3) the processor runs the memory testing program in the ROM to roundly test the memory; (4) the test is completed, and the testing result is preserved; (5) an application program starts up in the memory, and the testing result is output to a user interface. The invention has the advantages that the hardware is not required to provide any information, and the hardware design and cost are simplified.

Description

technical field [0001] The invention relates to memory testing technology in tooling testing of embedded systems. Background technique [0002] As in the embedded system tooling test, the memory test is an essential test item. By testing the memory, it is found that the welding fault of the memory in the device or the fault of the memory itself can improve the pass rate of the product when it leaves the factory. At present, the more popular method is to test the memory of the embedded system through test equipment. Due to the increase of hardware tools, unnecessary hardware tool purchase and management costs are brought. Contents of the invention [0003] The technical problem to be solved by the present invention is to provide a software-controlled memory test method capable of comprehensively testing the memory in order to reduce the test cost. [0004] The technical scheme that the present invention adopts for solving the above-mentioned technical problem is, a kind of...

Claims

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Application Information

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IPC IPC(8): G06F11/22
Inventor 何三波
Owner MAIPU COMM TECH CO LTD
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