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Test unit device for novel QFN integrated circuit testing separator

A technology for testing sorters and integrated circuits, applied in electronic circuit testing, sorting and other directions, can solve the problems of inaccurate test data, unstable testing, and high cost

Inactive Publication Date: 2008-08-27
江阴新基电子设备有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The previous test unit device does not have product positioning, clamping device, etc., so its test is not stable, the test data is not accurate, the service life of the golden finger is low, and the cost of the user is high

Method used

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  • Test unit device for novel QFN integrated circuit testing separator
  • Test unit device for novel QFN integrated circuit testing separator
  • Test unit device for novel QFN integrated circuit testing separator

Examples

Experimental program
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Embodiment Construction

[0018] Referring to Figures 1-2, the new QFN integrated circuit test sorter test unit device involved in the present invention is mainly composed of a push cylinder assembly 1, a test main seat assembly 2, a test nozzle seat assembly 3, a golden finger holder 4, and a stopper Component 5, test runner component 6, slide rail component 7, rotating block component 8, photoelectric switch component 9, and positioning cylinder component 10.

[0019] The push cylinder assembly 1 is mainly composed of a push cylinder 1.1, a push cylinder fixing seat 1.2, a floating joint 1.3, a linkage rod 1.4 and a support rod 1.5. The test main seat assembly 2 is mainly composed of a test main seat 2.1 and a guide rod 2.2. There are four support rods 1.5, and the four support rods 1.5 are supported and connected between the push cylinder fixed seat 1.2 and the test main seat 2.1. The push cylinder 1.1 is fixedly connected in the middle of the push cylinder fixing seat 1.2, the piston rod of the pu...

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Abstract

The invention relates to a novel QFN integrated circuit test separator testing unit device which comprises a pushing cylinder component (1), a testing main seat component (2), a test suction nozzle seat component (3), a gold finger fixing seat (4), a material stop component (5), a testing interval channel component (6), a slide rail component (7), a rotary block component (8), a photoelectric switch component (9) and a locating cylinder component (10), wherein the pushing cylinder component (1) comprises a pushing cylinder (1.1), a pushing cylinder fixing seat (1.2), a float joint (1.3), a linkage rod (1.4) and a support bar (1.5); the test suction nozzle seat component (3) comprises a test suction nozzle seat (3.1) and a locating grip jaw (3.3); the material stop component (5) comprises a material stop cylinder (5.1), a material stop block (5.2) and a material stop cover board (5.3); the testing interval channel component (6) comprises a testing interval channel (6.1) and a testing rotating block (6.3); the slide rail component (7) comprises a slide rail holder (7.1), a slide rail block fixing seat (7.2), a slide rail block (7.3) and a slide rail (7.4); moreover, the rotary block component (8) comprises a rotary block I (8.1) and a rotary block II (8.5). The device ensures that a test is stabler and more accurate.

Description

technical field [0001] The invention relates to a testing and sorting machine for integrated circuit series products, in particular to a test unit device of a novel QFN integrated circuit testing and sorting machine. It is suitable for testing and sorting of QFN integrated circuit products for communication products with high requirements such as LCD and mobile phones. Background technique [0002] QFN integrated circuit testing and sorting machine is mainly a mechatronic equipment composed of many mechanical parts with pneumatic components, stepping motors, optical fiber sensors, etc., and its program control is written by PLC. It is mainly composed of six local units including feeding unit, rotating unit, flow channel unit, testing unit, shuttle unit and distributing unit. Different from the general traditional test sorter, the test sorter of QFN IC series products requires very high test accuracy, and electrical requirements are also an important part, so the price of th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28B07C5/344
Inventor 王新潮曾坤灿陈子文沈幸福丁峰华李亚峰徐建春吴忠其
Owner 江阴新基电子设备有限公司