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High resolution spectral measuring apparatus

A high-resolution spectrum and measurement device technology, applied in absorption/scintillation/reflection spectroscopy, spectrum investigation, optical waveguide coupling, etc., can solve problems such as complex structures, and achieve improved resolution, high resolution, and increased sensitivity Effect

Inactive Publication Date: 2008-10-08
蔡小舒
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  • Abstract
  • Description
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Problems solved by technology

However, the structure of this high-resolution spectral measurement device is relatively complicated.

Method used

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  • High resolution spectral measuring apparatus
  • High resolution spectral measuring apparatus

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Embodiment Construction

[0022] The embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings, but the present embodiments are not intended to limit the present invention, and any similar structures and similar changes of the present invention should be included in the protection scope of the present invention.

[0023] A high-resolution spectral measurement device provided by an embodiment of the present invention includes a light dispersion and spectral measurement device composed of two or more dispersion elements, optical fiber bundles, CCD area arrays, CMOS area arrays, or other area array photosensitive elements. measuring system.

[0024] When the incident light passes through the incident slit and irradiates the first dispersion element, the dispersion becomes a continuous or discrete spectrum, and several optical fibers are used to receive the spectrum, and the spectrum is decomposed into several sub-light bands, and each optic...

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Abstract

The invention provides a high resolution spectrum measurement device which relates to the spectrum measurement technology field and solves a spectrum measurement problem of improving sensitivity and resolution. The measurement device from a light incident end comprises an incident lens, a plurality of sets of dispersive propagation parts, a slit, a terminal dispersive element and a planar array photosensitive element in turn. Each set of dispersive propagation part from a light input end comprises a dispersive element, a cylindrical lens, a plurality of roots of fiber bundles arrayed according to straight line. Incident light forms parallel light via the incident lens to irradiate on a first dispersive element to process subsection. The dispersive incident light via the first dispersive element is focalized via the cylindrical lens to process subsection and then enters into a plurality of roots of fiber bundles, and then is propagated to the dispersive element of posterior one set of dispersive propagation part to process subsection again, or reaches the terminal dispersive element via the slit, then is irradiated on the planar array photosensitive element to transform into electrical signals, so as to complete spectrum measurement. The invention is characterized in high resolution, high sensitivity, and measuring dynamic spectrum or transient spectrum.

Description

technical field [0001] The present invention relates to spectrum measurement technology, in particular to a technology for realizing high-resolution spectrum measurement by using multiple dispersion elements, optical fibers and area array photosensitive elements, such as CCD, CMOS, PDA and the like. Background technique [0002] Spectral measuring devices are widely used measuring and analyzing instruments, and are widely used in various industries. Existing spectral measurement devices use dispersive elements such as prisms or gratings to disperse incident light into a spectrum that composes the incident light. There are two types of methods for measuring spectra. The first type is to fix the exit slit, and a photodetection element, such as a photomultiplier tube, is installed at the exit of the exit slit. When the incident light passes through the incident slit and irradiates the dispersive element, the dispersive element is rotated so that the dispersed spectral signal c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/42G02B6/32
Inventor 蔡小舒
Owner 蔡小舒
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