Double monocular white light three-dimensional measuring systems calibration method

A calibration method and three-dimensional measurement technology, applied in the direction of measuring device, diagnostic recording/measurement, optical device, etc., can solve the problems of increasing appearance volume and production cost, inconvenient calibration, and unsuitable dual-monocular three-dimensional measurement system
CN101308012AInactive Publication Date: 2008-11-19三的部落(上海)科技股份有限公司
0 Cites 37 Cited by

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
三的部落(上海)科技股份有限公司
Publication Date
2008-11-19
Estimated Expiration
Not applicable · inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

Disclosed is a calibration method for parameters of a double monocular white light three-dimensional measurement system, which belongs to the field of optical measurement and mechanical engineering. The method adopts a plane calibration board as a known calibration object positioned in the measuring range of the system, and obtains the corresponding projection pixel point of a calibration spot in a left camera and the absolute phase value through processing a structured light fringe image on the calibration board projected by a left slide projector and taken by the left camera, and the corresponding projection pixel point of a calibration spot in a right camera and the absolute phase value through processing the structured light fringe image on the calibration board projected by a right slide projector and taken by the right camera. The method goes on linear calibration to a left and a right single measuring head according to the basic data calibrated by the system to obtain as much initial value of parameters of the measurement system as possible and overall nonlinear optimized calibration to the measurement system based on the linear calibration to obtain the optimized value of all the parameters of the measurement system, thereby realizing the precise calibration of parameters of the double monocular white light three-dimensional measurement system.
Need to check novelty before this filing date? Find Prior Art

Description

Calibration method of dual-monocular white light three-dimensional measurement system Technical field: The invention relates to a calibration method for a three-dimensional measurement system, in particular to a calibration method for parameters of a dual-monocular white light three-dimensional measurement system using a slide projector. It belongs to the technical fields of optical measurement and mechanical engineering. Background technique: The traditional camera calibration method is to obtain the calibration basic data by taking a calibration reference object of known size and processing the captured image, so as to realize the calibration of the camera parameters. The basic data of camera calibration establishes the correspondence between the measured coordinate system coordinates of known calibration points and the projected pixel coordinates of calibration points acquired by camera image processing; the traditional calibration method of projectors is to project a c...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More