TFT-LCD panel test system and its test method

A panel testing and panel technology, applied in the field of TFT-LCD, can solve the problems of complex design, high cost, and inability to detect LCD panels, and achieve the effect of reducing additional costs

Inactive Publication Date: 2008-12-31
SHENZHEN SKYWORTH RGB ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the design of these two methods is relatively complicated and the cost is relatively high. More importantly, the above two methods need to bind the IC first, ...

Method used

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  • TFT-LCD panel test system and its test method
  • TFT-LCD panel test system and its test method
  • TFT-LCD panel test system and its test method

Examples

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Embodiment Construction

[0014] see figure 1 , figure 2 As shown, a TFT-LCD panel testing system of the present invention includes a mechanical structure part and a circuit structure part. The mechanical mechanism part includes handle A, sliding plate B, probe C, panel placement groove D and power switch E. In addition, R, G, B buttons are also arranged on the base of the mechanical mechanism. The panel to be tested is placed on the placement groove D, the sliding plate B is used to fix the probe C, and the handle A is used to crimp the probe C and the test point on the panel; wherein, the sliding plate B and the panel are placed Slot D can be replaced according to different types of panels. When applying, first place the panel to be tested in the panel placement groove D, adjust the position of the sliding plate B and the panel placement groove D, press the handle A, so that the probe C just presses on the test point of the panel to be tested; then Fix the sliding plate B and the housing groove ...

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PUM

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Abstract

The invention discloses a TFT-LCD panel testing system and a testing method thereof, comprising a mechanical structure part and a circuit structure part; the mechanical structure part comprises a panel receiving trough used for receiving the panel to be tested, a probe, a sliding plate used for fixing the probe, a handle used for pressing and jointing the probe and the testing points on the panel, and a power switch; the circuit part comprises a panel driving circuit and a back light generation circuit; the required voltage waveform is generated by a square wave generation circuit; furthermore, different voltage waveforms are added on the panel testing points to drive the LCD by the probe so as to display different colours, thus detecting the defected panel. The LCD panel can be detected before the IC is bound, and the panel with defects such as bad point, line lack, row lack, etc., can be detected so as to reduce the additional cost caused by the poor production material.

Description

【Technical field】 [0001] The invention relates to the technical field of TFT-LCD, in particular to a TFT-LCD panel test system and a test method thereof. 【Background technique】 [0002] Generally, the manufacturers of TFT-LCD panels will test them before leaving the factory. Due to the complexity of the testing equipment, LCD module manufacturers generally will not test the panels again, but for defective products in production, especially due to IC or It is impossible to determine whether the defective panel caused by FPC binding caused the defective panel during the repair process. Therefore, it is very necessary to test these panels so that they can be put into production again to reduce production costs. At present, there are two testing methods for TFT-LCD panels: one method is to use a detection device with a detection head to detect, using a detection device with multiple detection heads, the detection head is coupled to the gate line of the liquid crystal panel, Sig...

Claims

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Application Information

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IPC IPC(8): G02F1/13G02F1/1362G01R31/00
Inventor 周忠伟邓春伟黄志兰李俊强
Owner SHENZHEN SKYWORTH RGB ELECTRONICS CO LTD
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