Memory body IC detecting and sorting machine

Abstract

The invention discloses a memory IC testing and classifying device, comprising a feeding box, an empty box, at least one receiving box and a transfer device arranged at the front end of the machine platform, and at least one testing device, a second transfer device and a removal receiving box arranged at the rear end of the machine platform, as well as a first material-moving device and a second material-moving device arranged among the feeding box, the receiving box and the testing box; the feeding box and the receiving box are used to hold the memory ICs to be tested / tested respectively; the testing device is a test circuit board provided with a plurality of test sheath seats; the first material-moving device transfers more than one memory IC to be tested in the feeding box to the firsttransferring device; the first transferring device is capable to preheat the held memory ICs to be tested, and make displacement movement to ensure the testing device to take materials at different positions. The invention is capable to transfer and test a plurality of memory ICs simultaneously, thereby, the testing capability is largely enhanced and the service efficiency of each device is improved effectively.

Description

technical field [0001] The invention relates to an IC detection and classification machine, in particular to a memory IC detection and classification machine. Background technique [0002] Nowadays, the ICs of semiconductor components are roughly divided into different types such as logic ICs, memory ICs, analog ICs, and micro-component ICs. Taking logic ICs as an example, they are applied to the central processing unit on the motherboard to be responsible for the central processing unit. Signal conversion or transmission of other peripheral components, as well as calculation operations, its functionality is more complicated, while the memory IC is simply used to store data and installed on the module circuit board, and the module circuit board is then assembled on the On the motherboard, its functionality is relatively simple, but no matter what type of IC, after the production is completed, it must go through a test operation to eliminate defective products and ensure prod...

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Problems solved by technology

[0004] Because the memory IC is purely used to store data, its functionality is relatively simple, so it is generally tested with multiple memory ICs at the same time; It is not possible to transfer and test multiple memory ICs to be tested at the same time, and only a single memory IC to be tested is carried at a time through the transfer device, which will make the standby time of the entire material transfer too long. If there are multiple test devices If a large-scale memory IC inspection machine is used, the operation and waiting time of each device will be more cumbersome and time-consuming, and it will also greatly reduce the inspection capacity of memory ICs. Therefore, IC inspection and sorting machines are not suitable for performing memory IC inspection operations.

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