Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Inspect method and inspect device

A technology of inspection device and inspection method, which is applied in measurement devices, circuit inspection/monitoring/correction, material analysis by optical means, etc., can solve the problems of long time required for inversion and complex structure, and achieve efficient inspection and simplification. Structure, easy to flip effect

Inactive Publication Date:
View PDF0 Cites 18 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the structure in the general device is very complicated, and the time required for inversion is relatively long.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Inspect method and inspect device
  • Inspect method and inspect device
  • Inspect method and inspect device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] Hereinafter, the embodiment of the present invention will be described in more detail based on FIGS. 1 to 10 .

[0049] Various modifications can be made to the embodiments of the present invention, and the scope of the present invention should not be interpreted as being limited to the following embodiments. This embodiment mode is for those having ordinary technical knowledge in the art to fully understand the present invention. Therefore, the shapes of elements in the drawings are emphasized for clarity.

[0050] In this embodiment, a case where the inspection target object is a printed circuit board B that is a substantially thin plate will be described as an example. However, the technical idea of ​​the present invention can also be applied to inspection items other than the printed circuit board B in addition to this.

[0051] FIG. 1 is a plan view schematically showing an embodiment of an inspection device 1 of the present invention. As shown in FIG. 1 , the i...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an inspection device and inspection method for efficiently inspecting an object to be inspected, such as an printed circuit board, etc. The printed circuit board moves from a move-in unit (10) to an inspection unit (30), performs orderly shooting, turning for upper surface, shooting for lower surface, then moves to a move-out unit (20). The printed circuit board moves between the move-in unit (10), the inspection unit (30) and the move-out unit (20), by using two arms (720, 740) configured to be a right angle, simultaneously the printed circuit board moves from the move-in unit (10) to the inspection unit (30), and from the inspection unit (30) to the move-out unit (20). Groove, formed on a carrier (340) for carrying the printed circuit board in the inspection unit (30), is used for inserting a finger part (510) for turning the printed circuit board, therefore the printed circuit board is lifted from the carrier (340) or carried on the carrier (340) by the movement of the finger part (510) in the groove.

Description

technical field [0001] The present invention relates to an inspection device and an inspection method, and more specifically, to an apparatus and method for optically inspecting whether an object such as a printed circuit board is defective. Background technique [0002] On printed circuit boards on which patterns, etc. examine. The above-mentioned inspection is mainly carried out by shooting the substrate with a camera, and detecting the lightness and darkness of each image area of ​​the image obtained by the image processor. In general, an inspection device continuously inspects a plurality of printed circuit boards. Therefore, in order to shorten the time required for the inspection, it is important to quickly transport the printed circuit board between the units in the device. [0003] In addition, when inspecting the upper and lower sides of the printed circuit board separately, it is necessary to provide a unit for reversing the printed circuit board. However, this...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/956G01N35/04
CPCG01N21/956G01N2021/95638H05K2203/16
Inventor 崔铉镐金敏秀
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com