Current fitting curve sudden change elimination method for liquid/liquid interface scanning electro-chemical microscope

A technology of scanning electrochemistry and curve fitting, which is applied in the field of liquid/liquid interface scanning electrochemical microscope current fitting curve jump elimination, can solve the problem of no jump elimination method for fitting current, and achieve the goal of eliminating signal jump Effect

Inactive Publication Date: 2009-04-08
NORTHWEST NORMAL UNIVERSITY
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Problems solved by technology

However, there is no report on the jump elimination method for the jump problem of the fitting current generated when the standard distance value is large.

Method used

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  • Current fitting curve sudden change elimination method for liquid/liquid interface scanning electro-chemical microscope
  • Current fitting curve sudden change elimination method for liquid/liquid interface scanning electro-chemical microscope
  • Current fitting curve sudden change elimination method for liquid/liquid interface scanning electro-chemical microscope

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Embodiment Construction

[0032] A liquid / liquid interface scanning electrochemical microscope current fitting curve jump elimination method, comprising the following steps:

[0033] (1) A liquid / liquid interface is established, the upper layer of the interface is an organic phase 4 containing reduced species, the lower layer is an aqueous phase, and the organic phase and water are immiscible with each other. In the present invention, the organic phase nitrobenzene is taken as an example for illustration.

[0034] (2) Press the scanning electrochemical microscope device to figure 1 The connection shown is realized by the CHI900 electrochemical workstation produced by CH Instrument Company of the United States.

[0035] Put the three-electrode system composed of probe 1, reference electrode 2, and counter electrode 3 into the organic phase 4, turn on the CHI900 electrochemical workstation, make the probe 1 gradually approach the liquid / liquid interface, and record the distance d between the probe and ...

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Abstract

The invention relates to an elimination method of the jump of a current fitting curve by a scanning electrochemical microscope on a liquid/liquid interface, comprising the steps as follows: (1) a liquid/liquid interface is established; (2) the probe of the scanning electrochemical microscope extends into an organic phase containing reduction-state species and is close to the liquid/liquid interface; the distance d from the probe to the interface and the current value of the probe are recorded; furthermore, the relationship curve between the distance d and the current value of the probe is established; (3) the distance d is standardized as L and the standardized probe current I<T><k> is fit; (4) the relationship curve of fit standardized distance and standardized current is established; (5) discrete wavelet transformation is carried out to the signals (L is more than 2) so as to extract the similar and detailed components; and (6) a minimum average detail discrete wavelet transformation method is used for eliminating the fitting current jump which is generated when L is more than 2. The invention provides the minimum average detailed discrete wavelet transformation method by the discrete wavelet transformation method, which solves the fitting current jump problem of the standard current theory fitting curve of the liquid/liquid interface at large standard distance value.

Description

technical field [0001] The invention relates to a probe current of a scanning electrochemical microscope at a liquid / liquid interface, in particular to a method for eliminating a jump in a current fitting curve of a scanning electrochemical microscope at a liquid / liquid interface. Background technique [0002] Scanning electrochemical microscopy is often used to study complex liquid / liquid interface electron and ion transfer kinetics, and its application simplifies many complex electrochemical problems of liquid / liquid interface charge transfer. [0003] The feedback mode is the main quantitative operation mode of the scanning electrochemical microscope. In this mode, the probe used by the microscope is a disc electrode with a radius a (usually 12.5 nm), and the probe current is directly generated by the electrons at the liquid / liquid interface. caused by transfer, so the probe current can be used to evaluate the oxidation state species (O 1 ) and reduced species (R in the ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N13/24G12B21/00G01Q60/60
Inventor 卢小泉陈晶
Owner NORTHWEST NORMAL UNIVERSITY
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