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Fractal analysis method for flicker source orientation

An analysis method and flicker source technology, applied in the field of testing, can solve problems such as the flicker source does not find a directional method, and achieve the effect of great practical value

Inactive Publication Date: 2009-12-09
NORTH CHINA ELECTRIC POWER UNIV (BAODING)
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Problems solved by technology

[0006] In short, there is no convenient, fast and accurate orientation method for the flicker source at present.

Method used

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  • Fractal analysis method for flicker source orientation
  • Fractal analysis method for flicker source orientation

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Embodiment Construction

[0038] The root cause of flicker is that fluctuating loads generate fluctuating currents, which cause voltage drops when fluctuating currents flow through the system impedance, resulting in voltage fluctuations within a specific frequency range. Fluctuating loads that also change drastically in current have different changing rules from a statistical point of view, such as electric arc furnaces and intermediate frequency furnaces in flicker source loads. Although the root mean square value of locomotive traction load (that is, electric railway load) fluctuates violently but the fluctuation period is large, it will cause fluctuations in the bus voltage but will not produce flicker. Therefore, the root mean square characteristics of the flicker source load and the non-flicker source load are obviously different, and the complexity of the waveform is also different. The key to flicker source orientation is to find the difference between flicker source and non-flicker source in so...

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Abstract

A fractal analysis method for flicker source orientation belongs to the testing technical field and is used for solving flicker source orientation problem. The technical scheme includes: firstly voltage and current data of each load is acquired in certain sampling frequency, then root mean square values of voltage and current in each power frequency period are calculated, and then fractal dimensions of the obtained root mean square values of voltage and current are calculated respectively, and finally the fractal dimension of the obtained root mean square value of voltage and the fractal dimension of the obtained root mean square value of current are compared with respective thresholds to judge whether a flicker source is existed in each branch. The invention takes whether the fractal dimensions of the root mean square value of voltage and the root mean square value of current are more than respective thresholds as criterion, and can conveniently, quickly and accurately find the flicker source producing voltage fluctuation in a power system only by acquiring voltage and current data of each load, thus causing flicking hazard to be effectively treated and having great practical value.

Description

technical field [0001] The invention relates to a method for analyzing and judging flicker source branch circuits that cause voltage fluctuations in power systems and cause lamp illuminance instability, and belong to the technical field of testing. Background technique [0002] The visual response of the human eye caused by the unstable light intensity caused by voltage fluctuations of electric light sources is called flicker, which is usually caused by various types of high-power fluctuating loads. In recent years, the proportion of impact and non-linear loads in the power system is increasing, which makes the frequency and amplitude of grid voltage fluctuations also increase, seriously affecting the power quality of the grid. The orientation of the flicker source, that is, to determine the branch where the flicker interference source is located, is of great significance for clarifying responsibilities and controlling power quality. At present, the research work in this ar...

Claims

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Application Information

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IPC IPC(8): G01R31/08
Inventor 赵成勇贾秀芳陈清
Owner NORTH CHINA ELECTRIC POWER UNIV (BAODING)
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