Method for evaluating reliability of stepping stress quickened degradation experiment based on time sequence

Abstract

The invention discloses a method for evaluating the reliability of a stepping stress quickened degradation experiment based on a time sequence. The method utilizes a correlation coefficient stationary sequence analytical method to describe non-equidistant stochastic information in stepping stress quickened degradation experiment data, establishes a regressive-non-equidistant autoregression degradation model on the basis of obtaining the respective advantages of a deterministic regression model and a stochastic correlation coefficient stationary sequence autoregression model, combines a grey theory to predict a product degradation trend and forms a function and a curve for predicting the life and evaluating the reliability of the stepping stress quickened degradation experiment based on the time sequence. The method obviously decreases the sample quantity of a product and shortens the time of the degradation experiment, thereby saving a large amount of expenses and resources, enhancing the fitting accuracy of the degradation model and enhancing the reliability of a reliability evaluating result.

Description

technical field [0001] The invention relates to an accelerated degradation test life prediction and reliability evaluation method, belonging to the technical field of accelerated test evaluation. Background technique [0002] For products with high reliability and long life, it is often difficult to observe product failure in a short period of time, and analyzing product reliability based on product performance degradation data has become an effective way. In order to evaluate the reliability of these products whose failure data are difficult to obtain but performance degradation data can be obtained, the method of accelerated degradation test came into being. [0003] To study accelerated degradation failure, the key is to establish an accelerated degradation model in which the characteristic parameters of product performance degradation change with time. Accelerated degradation models are generally divided into two types based on degradation mechanism and statistical data...

AI Technical Summary

Problems solved by technology

[0012] The purpose of the present invention is to solve the problem that the traditional accelerated degradation model cannot describe the randomness information in the statistical data of the accelerated degradation test, and the existing accelerated degradation test reliability assessment method is difficult to apply to the accelerated degradation test reliability assessment of the step stress level To solve the problem, time series analysis and modeling techniques are adopted to achieve the technical effect of reasonably predicting product life and reliability evaluation based on step stress accelerated degradation test data

Images