Method for evaluating reliability of stepping stress quickened degradation experiment based on time sequence
Patent Information
- Authority / Receiving Office
- CN ยท China
- Current Assignee / Owner
- BEIHANG UNIV
- Publication Date
- 2010-01-06
- Estimated Expiration
- Not applicable ยท inactive patent
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Abstract
Description
technical field
[0001] The invention relates to an accelerated degradation test life prediction and reliability evaluation method, belonging to the technical field of accelerated test evaluation. Background technique
[0002] For products with high reliability and long life, it is often difficult to observe product failure in a short period of time, and analyzing product reliability based on product performance degradation data has become an effective way. In order to evaluate the reliability of these products whose failure data are difficult to obtain but performance degradation data can be obtained, the method of accelerated degradation test came into being.
[0003] To study accelerated degradation failure, the key is to establish an accelerated degradation model in which the characteristic parameters of product performance degradation change with time. Accelerated degradation models are generally divided into two types based on degradation mechanism and statistical data...