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Universal power-aging testing system

A technology of aging test and universal power supply, which is applied in the direction of power supply test, etc., can solve the problems of versatility, flexibility, real-time and poor operability, etc., and achieve the effect of improving operability, comprehensive testing and improving versatility

Inactive Publication Date: 2010-02-17
MAIPU COMM TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the problems of poor versatility, flexibility, real-time and operability existing in the existing power supply aging system, and provide a general power supply aging test system, which can meet the versatility of multi-standard power supplies and the requirements of data collection in the test process. Requirements for comprehensiveness, real-time and operability

Method used

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Embodiment Construction

[0024] The present invention will be further described below in combination with specific embodiments and accompanying drawings.

[0025] figure 1 It is a schematic diagram of the general power supply aging test system of the present invention, including a placement rack carrying the power supply under test and a power supply supplying power to the power supply under test, and

[0026] Electronic load, as the load of the power supply under test;

[0027] The host computer monitoring subsystem is used to receive data from the control acquisition subsystem, and output test parameters and control commands to the control acquisition subsystem;

[0028] The control acquisition subsystem is respectively connected with the power supply under test, the electronic load and the monitoring subsystem of the upper computer; it is used to receive the test parameters and control commands of the monitoring subsystem of the upper computer; and adjust the electronic load signal according to th...

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Abstract

The invention discloses a universal power-aging testing system which belongs to aging testing systems of electronic products and aims to solve the problems of poor universal property, flexibility, real-time performance and operability of the prior power aging systems. The system comprises a placement frame, a power supply source, an electronic load, a host computer monitor and control subsystem and a control and collection subsystem, wherein the placement frame bears the power supply to be tested, the power supply source supplies power to the power supply to be tested, and the electronic loadis used as the load of the power supply to be tested; and the host computer monitor and control subsystem is used for receiving data of the control and collection subsystem and transmitting test parameters and control commands to the control and collection subsystem; and the control and collection subsystem is respectively connected with the power supply to be tested, the electronic load and the host computer monitor and control subsystem, and used for receiving the test parameters and the control commands of the host computer monitor and control subsystem as well as the status information ofthe power supply to be tested, and also used for adjusting the electronic load signals according to the status information of the power supply to be tested so as to control the aging testing process.

Description

technical field [0001] The invention relates to an aging test system for electronic products, in particular to an aging test system for a power supply. Background technique [0002] Aging test is an important means of quality control of electronic products. Electronic products usually need to be aged for a certain period of time before leaving the factory to ensure the quality of the factory, and eliminate early failure products. As an electronic product or an integral part of an electronic product, the stability of the power supply directly affects the stability of the electronic product, so a strict aging test is required before the power supply leaves the factory, and if the entire power supply aging process can be monitored in real time , collect the test results during the whole process of testing, give real-time alarms and protect the circuit for the abnormal voltage, current and temperature in the aging process of the power supply, which can further improve the real-...

Claims

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Application Information

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IPC IPC(8): G01R31/40G01R31/42
Inventor 罗文武李霞王兴爽
Owner MAIPU COMM TECH CO LTD
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