Analysis and test system and test method for junction temperature of semiconductor lamp

Abstract

The invention discloses an analysis and test system and a test method for the junction temperature of a semiconductor lamp. The system comprises a radiation power tester, an electrical parameter generating and measuring apparatus, a temperature tester, a variable-environment lamp test integrating sphere, a test reference point and light source module temperature distribution computing module, a light source module thermal resistance distribution and junction temperature computing module, a multi-working point optimization and analysis module and a central monitoring and processing computer. The test system provided by the invention can effectively test the junction temperature distribution of the lamp under conditions of normal working state of the semiconductor lamp and no damage to the structure of the lamp. The system is formed based on a concept that: the whole semiconductor lamp is used as an object of study, a proper part of a light module is used as a test reference point, and the junction temperature of the semiconductor lamp is analyzed by a method combining physical test, a numerical model, a physical model and computer thermal test.

Description

technical field [0001] The invention belongs to the field of detection of lighting lamps, and in particular relates to a junction temperature analysis and testing system of semiconductor lighting lamps and a testing method thereof. Background technique [0002] White light LED (Light Emitting Diode), white light emitting diode, referred to as white light LED, is a semiconductor device that can convert electrical energy into white light. The characteristics of the white light LED light source are: the LED uses a low-voltage power supply, and the power supply voltage is 6-24v, which can obtain high enough brightness; the energy consumed by the LED is 80% less than that of an incandescent lamp with the same light effect, and the light-emitting response speed is fast, and the high-frequency characteristics Good, can display pulse information; small size, the shape of the light-emitting surface is divided into circular, rectangular, etc., and there are various specifications, so ...

AI Technical Summary

Problems solved by technology

The above is the current status of junction temperature analysis and testing of semiconductor lighting fixtures. Effective junction temperature parameter values ​​cannot be obtained through current methods and patents, which severely limits the research and development, manufacturing and industrialization of semiconductor lighting fixtures.

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