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Auxiliary detection device and method of image processing for on-line flaw detection of rails

An auxiliary detection and image processing technology, applied in the direction of optical testing flaws/defects, etc., can solve problems such as inconvenient operation, increased operating costs, and low efficiency

Inactive Publication Date: 2010-04-28
BEIJING JIAOTONG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this way, not only the operation is inconvenient, the efficiency is low, but also the operation cost is increased.

Method used

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  • Auxiliary detection device and method of image processing for on-line flaw detection of rails
  • Auxiliary detection device and method of image processing for on-line flaw detection of rails
  • Auxiliary detection device and method of image processing for on-line flaw detection of rails

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Embodiment Construction

[0014] Embodiments of the present invention are described in detail below in conjunction with the accompanying drawings:

[0015] Such as figure 1 As shown, an image processing auxiliary detection device for online rail flaw detection includes an industrial CCD line array camera 206, auxiliary light sources 207, 208, and a control cabinet 107; the control cabinet includes an embedded system 204, a system power supply 202, a communication interface 201, and a light source Excitation controller 203, digital line array image acquisition interface 205. Wherein, the industrial CCD line array camera 206 is connected with the line array image acquisition interface 205; the auxiliary light sources 207, 208 are connected with the light source excitation controller 203; the system power supply 202, the communication interface 201, the light source excitation controller 203, the digital line array image The collection interface 205 is respectively connected with the embedded system 204 ...

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Abstract

The invention relates to an auxiliary detection device and a method of image processing for the on-line flaw detection of rails. In the on-line running process of a train, an embedded type control system controls a light source excitation controller to enable two auxiliary light sources to irradiate the surfaces of rails, an industrial CCD line array camera collects image information at the surfaces of the rails by the control of a digital line array image collection interface, the information is transmitted to the embedded type system, and the embedded type system processes the collected rail image by an image processing technology; the flaw information and the inherent structure information of the surfaces of the rails are calculated from the processed rail image; then, the obtained flaw information of the surfaces of the rails is classified, and the flaw degree is calculated; and finally, the flaw classification and degree information is transmitted to an on-line rail flaw detection device by a communication interface, and then information integration is carried out on the transmitted information and a collection signal of the on-line rail flaw detection device, thereby reducing the interference degree of surface flaws to the on-line rail flaw detection device when detecting flaws inside the rails.

Description

technical field [0001] The invention relates to an image processing auxiliary detection device and method for online rail flaw detection. Background technique [0002] The inherent geometric structure and surface damage of the rail have a great influence on the detection results of the online rail flaw detection, making it impossible for the online rail serious flaw detection device to distinguish the internal nuclear damage of the rail from the triangular pits and peeled off pieces on the rail surface. The inherent geometric structure and surface damage of the rail not only have an impact on the rail flaw detection equipment based on the electromagnetic principle, but also have a greater impact on the rail flaw detection equipment based on the ultrasonic principle, because the ultrasonic flaw detection requires the sensor to be closely attached to the rail, and the coupling degree of the contact surface directly affects detection results. Therefore, a problem that must be ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88
Inventor 刘泽王嵬张广伟
Owner BEIJING JIAOTONG UNIV
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