Monitoring device and method for crop growth uniformity

A monitoring device and a technology for uniformity, which are applied in the field of monitoring devices for the uniformity of crop growth, can solve the problems of increased measurement difficulty, long update cycle, and large workload.

Active Publication Date: 2012-04-25
NONGXIN TECH BEIJING CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] In practical applications, the monitoring of crop growth uniformity and the acquisition of related indicators require a lot of manpower and material resources
Due to the need to go to the field to investigate the differences in the growth of crops, there are disadvantages such as heavy workload, low degree of automation, and long update cycle.
Moreover, when a large-scale survey of crop growth uniformity is required, the measurement difficulty will also increase
At the same time, the differences in crop growth in different farmland plots are ubiquitous, relying solely on manual survey data is no longer able to meet the needs of modern agricultural management

Method used

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  • Monitoring device and method for crop growth uniformity
  • Monitoring device and method for crop growth uniformity
  • Monitoring device and method for crop growth uniformity

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Experimental program
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Embodiment 1

[0075] The first preferred embodiment of the present invention proposes a monitoring device for crop growth uniformity, its structure is as follows: figure 1 shown, including:

[0076] A remote sensing image processing module, the remote sensing image processing module performs radiation correction, atmospheric correction and geometric correction on the satellite remote sensing image according to the obtained satellite remote sensing image;

[0077] A plot vector data processing module, the plot vector data processing module classifies the crops in the satellite remote sensing images to obtain the spatial distribution map of the target crops; and classifies the grids in the classified satellite remote sensing images The result is converted into area vector data; then the plot boundaries of the spatial distribution map are corrected;

[0078] Vegetation index processing module, the vegetation parameter processing module calculates the vegetation index NDVI of the plot accordin...

Embodiment 2

[0089] The second preferred embodiment of the present invention is improved on the basis of the first preferred embodiment, that is, the block vector data processing module includes:

[0090] Spatial distribution map processing sub-module, the spatial distribution map processing sub-module classifies the crops in the satellite remote sensing images to obtain the spatial distribution map of the target crops; and converts the raster classification of the spatial distribution map into surface shape vector data;

[0091] The land use data processing sub-module; the land use data processing sub-module performs visual interpretation on the satellite remote sensing image according to the satellite remote sensing image to obtain the reference time phase land use special data of the historical data;

[0092] A plot boundary processing sub-module, the plot boundary processing sub-module superimposes the surface vector data and the reference phase land use thematic data, and extracts the...

Embodiment 3

[0096] The third preferred embodiment of the present invention is improved on the basis of the first preferred embodiment and the second preferred embodiment, that is, the vegetation index processing module includes:

[0097] The spectral feature processing sub-module, the spectral feature processing sub-module extracts the remote sensing data corresponding to the plot, and obtains the spectral feature information of different time phases and different bands of crops according to the remote sensing data;

[0098] Vegetation parameter processing sub-module, the vegetation parameter processing sub-module performs band operation on spectral feature information to obtain vegetation index NDVI;

[0099] NDVI = ( R nir - R red ) ( R nir ...

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Abstract

The invention discloses a monitoring device and a method for crop growth uniformity degree, aiming at the problem of low efficiency for manually investigating data. The device comprises a remote sensing image processing module, a plot vector data processing module, a vegetation index processing module and a growth uniformity processing module. The method comprises: obtaining the remote sensing images of a satellite; carrying out radiometric ratification, atmospheric correction and geometric correction according to the remote sensing images of the satellite; classifying crops in the remote sensing images of a satellite to obtain a spatial distribution map; converting a grid classification result in the spatial distribution map into facet vector data; processing the spatial distribution mapto correct the plot boundary of the crops; according to the spectral characteristics of the plot in the remote sensing image, calculating the vegetation index of the plot; and calculating the growth uniformity degree index according to the vegetation index of each plot. The invention uses the integration of the grid and the vector data to monitor the growth uniformity degree of crops in natural plots and performs the advantages of remote sensing data.

Description

technical field [0001] The invention relates to a monitoring device and method for crop growth uniformity. Background technique [0002] Crop growth monitoring refers to the macro-monitoring of crop seedling condition, growth status and changes, which requires timely and comprehensive reflection of agricultural conditions. The uniformity of crop growth has always been an important index to evaluate the quality of crop growth. This index can not only reflect the differences in soil fertility and topography of different farmland plots, but also reflect the management level of different cultivators. [0003] The growth uniformity of traditional crops is mostly determined through field sampling surveys. For example, the basic seedling uniformity index P of winter wheat proposed by Ma Aiguo et al. in 2001 is a random sampling method. This method determines the number of survey points according to the area of ​​each plot, and then arranges the seedlings of each survey point in e...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S17/00
Inventor 王纪华宋晓宇赵春江黄文江李存军常红徐新刚顾晓鹤杨贵军杨小冬杨浩
Owner NONGXIN TECH BEIJING CO LTD
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