Method and system for controlling power supply test and power supply test method

A technology of power supply testing and test control, which is applied in the field of testing, can solve the problems of low test efficiency and prone to missing tests, improve test quality and efficiency, reduce missed tests and misjudgments, and improve the power supply test process.

Inactive Publication Date: 2010-09-01
深圳市东辰科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the embodiments of the present invention is to provide a power supply test control method, aiming at solving various problems in the power supply test process provided by the prior art, such as the problems of prone to missing test and low test efficiency.

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  • Method and system for controlling power supply test and power supply test method

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Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0026] In the embodiment of the present invention, the pre-configured power supply test flow information is read, and the power supply test flow information includes power supply test standard parameters and power supply test item information; Instructions for testing the above-mentioned power supply test items, controlling the power supply test auxiliary equipment to test the parameters of the power supply to be tested; receiving the test result parameters fed back by the power supply test auxiliary equipment; The parameters are compared with the standard parameters of the power supply test to ...

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Abstract

The invention is applied in the field of test technology and provides a method and a system for controlling a power supply test and a power supply test method. The method comprises the following steps of: reading preconfigured power supply test process information which comprises power supply test standard parameters and power supply test item information; according to the power supply test item information, sending a power supply test item testing command to power supply test auxiliary equipment and controlling the power supply test auxiliary equipment to test all parameters of a power supply to be tested; receiving test result parameters fed back by the power supply test auxiliary equipment; comparing the test result parameters which are fed back by the power supply test auxiliary equipment with the power supply test standard parameters and judging whether power supply test items pass the test or not; and when the power supply test items pass the test, generating and storing a test report. The method and the system for controlling the power supply test and the power supply test method perfect the conventional power supply test process, reduce the test leakage and the wrong judgment and improve the test quality and efficiency.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a power supply test control method, system and power supply test method. Background technique [0002] The power supply is widely used in modern electronic products and is an energy conversion device. The power supply provides the voltage and current required for normal operation to electronic products, and is the power heart of electronic products. The power supply of the power supply is directly related to whether the electronic system can work normally. At present, there are many types of electricity, and the demand is very large. This has brought great troubles to the product testing of power supply manufacturers. Now the general testing process is: testers follow the test steps in the test operation instruction and test step by step. Then judge the quality of the power supply according to the test results. [0003] There are many problems in the above test p...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/40
Inventor 张书成
Owner 深圳市东辰科技有限公司
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