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Testing device

A test device and test switch technology, which is applied to the casing of the measurement device, static indicators, instruments, etc., can solve the problems of easy arc generation, no protection mechanism, damage to the liquid crystal display panel 50, etc., and achieve the effect of preventing arc damage.

Inactive Publication Date: 2012-07-04
AU OPTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the existing test device 100 has no protection mechanism, and the probe card 120 can still be lifted during the test.
If the tester accidentally lifts the probe card 120 during the test, an electric arc is likely to occur, resulting in damage to the liquid crystal display panel 50

Method used

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Embodiment Construction

[0060] figure 2 is a three-dimensional schematic diagram of a test device according to an embodiment of the present invention, image 3 yes figure 2 The schematic diagram when the middle cover is lifted from the base, while Figure 4 yes figure 2 Schematic view of the middle slide in the power off position. Please refer to Figure 2 to Figure 4 , the test device 200 of this embodiment includes a base 210 , a cover 220 and a test switch 230 . The base 210 has a connecting unit 212 , and the cover 220 has a first side 221 and a second side 223 opposite to each other. The first side 221 is pivotally connected to the base 210 , and the second side 223 is provided with a first fixing member 222 . The first fixing part 222 is suitable for fixing the cover 220 to the base 210 when the cover 220 is covered on the base 210 . The test switch 230 is disposed beside the base 210 , and the test switch 230 has a sliding part 232 . This slider 232 is adapted to be in the power-on ...

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Abstract

The invention discloses a testing device comprising a base, a cover plate and a testing switch, wherein the base is provided with a connecting unit; the cover plate is provided with a first side and a second side which are opposite. The first side is pivoted with the base, and the second side is provided with a first fixing part. The first fixing part is suitable for fixing the cover plate on thebase when the cover plate covers on the base. The testing switch is arranged beside the base, and the testing switch is provided with a sliding part. The sliding part is suitable for sliding between a power on position and a power off position, wherein the power on position is nearer to the base than the power off position. The sliding part is provided with a second fixing part, and when the cover plate covers on the base and the sliding part is located at the power on position, the second fixing part fixes the cover plate. The testing device can protect objects to be tested from being damaged by electric arcs.

Description

technical field [0001] The present invention relates to a test device, and in particular to a test device for electrical testing. Background technique [0002] figure 1 It is a schematic diagram of a test device in the prior art. Please refer to figure 1 , the existing test device 100 includes a substrate 110 and a probe card 120 , wherein the probe card 120 is pivotally connected to the substrate 110 . The probe card 120 can be lifted or covered, figure 1 The state where the probe card 120 is covered is shown. In addition, the substrate 110 has an accommodating groove 112 for supporting the liquid crystal display panel 50 . The probe card 120 has probes 122 for testing the LCD panel 50 and an opening 124 exposing the LCD panel 50 . [0003] The testing method of the existing testing device 100 is to lift the probe card 120 first to place the liquid crystal display panel 50 in the accommodating groove 112 . Afterwards, the probe card 120 is covered again, so that the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R1/04G09G3/00
Inventor 范咏达林政昌黄大益罗日郎梁嘉杉
Owner AU OPTRONICS CORP
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