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Sense amplifier and sensing method

A technology of sensing amplifiers and sensing methods, which is applied in the direction of instruments, static memories, read-only memories, etc., and can solve problems such as the reduction of storage unit density

Active Publication Date: 2013-07-24
TAIWAN SEMICON MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In many applications, short bit lines with fewer memory cells are often used to achieve large gap voltages, which limits the number of memory cells connected to the sense amplifier and reduces the density of memory cells

Method used

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  • Sense amplifier and sensing method
  • Sense amplifier and sensing method
  • Sense amplifier and sensing method

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Embodiment Construction

[0029] Embodiments or examples of the accompanying drawings of the present invention will be described as follows. The scope of the present invention is not limited thereto. Those skilled in the art should be able to understand that some modifications, substitutions and substitutions can be made without departing from the spirit and structure of the present invention. In the embodiments of the present invention, reference numerals may be used repeatedly, and several embodiments of the present invention may share the same reference numerals, but the characteristic elements used in one embodiment are not necessarily used in another embodiment use.

[0030] Example of Operation of Sense Amplifiers and Memory Cells

[0031] figure 1 A circuit 100 according to an embodiment of the present invention is shown to illustrate a sense amplifier 105 used with a memory cell 195 . Transistor 190 enables mutual access between sense amplifier 105 and memory unit 195 .

[0032] Sense am...

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PUM

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Abstract

Embodiments of the invention are related to sense amplifiers. In an embodiment involving a sense amplifier used with a memory cell, signals BL, ZBL, SN and SP are pre-charged and equalized to a voltage reference, e.g., Vref, using an equalizing signal. A compensation signal, e.g., SAC, is applied to compensate for the mismatch between transistors in the sense amplifier. The word line WL is activated to connect the memory cell to a bit line, e.g., bit line ZBL. Because the memory cell shares the charge with the connected bit line ZBL, it causes a differential signal to be developed between bit lines BL and ZBL. When enough split between bit lines BL and ZBL is developed, signals SP and SAE are raised to VDD (while signal SN has been lowered to VSS) to turn on the sense amplifier and allow it to function as desire. Other embodiments and exemplary applications are also disclosed.

Description

technical field [0001] The present invention relates to sense amplifiers. In various embodiments, sense amplifiers are used to electrically compensate for semiconductor process mismatches, thereby enabling sensing of smaller bit line gap voltages and allowing a greater number of memory cells to be connected to the sense amplifiers. Background technique [0002] Due to the mismatch of the semiconductor process, in order to sense the data reliably, the known sense amplifier needs a large bit line split voltage (bit line split). The bit line gap voltage is the voltage difference between two bit lines (such as bit lines BL and ZBL). To simplify the description, the bit line gap voltage is referred to as the gap voltage for short. In many applications, short bit lines with fewer memory cells are often used to achieve large gap voltages, which limits the number of memory cells connected to the sense amplifier and reduces memory cell density. Contents of the invention [0003] ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C7/06G11C16/26
CPCG11C7/065G11C7/08
Inventor 欧图尔·卡图契马颜克·泰曜
Owner TAIWAN SEMICON MFG CO LTD