Virtual instrument bus type multifunctional maintenance test device

Abstract

The invention discloses a virtual instrument bus type multifunctional maintenance test device, which comprises a computer, a control bus, a virtual instrument box, a cable and a tested element, wherein the control bus is connected between the computer and the virtual instrument box, the cable is connected between the virtual instrument box and the tested element, a virtual panel used for repairing and testing the tested element is arranged in the computer, a discrete quantity module, a small current switch, a large current switch, a switching quantity module and a data collection card are arranged in the virtual instrument box, a test hole panel is arranged on the cable, and is used for introducing out signals of the tested elements to be manually detected, and both ends of the cable are connected with connecting insertion elements. The test device adopts few elements, and has stable performance and convenient use, the cost is between the cost of a traditional electronic test table and the cost of an advanced integrated ATE test table, and the invention can be easily popularized.

Description

technical field [0001] The invention relates to the field of maintenance and testing of avionics equipment, in particular to a virtual instrument bus type multi-purpose maintenance tester. Background technique [0002] In the maintenance and repair of early mainline aircraft such as MD82, B737-200, TY154, as well as today's regional airliners, business jets, helicopters and other aircraft on-board electronic equipment, most of the equipment needs test benches for testing and repair support. Its function is to provide power, discrete signals, grounding codes, indications of working status to the airborne equipment to be tested and repaired, and to lead out the signal of the equipment to be tested for easy detection. [0003] Domestic capable independent maintenance units have made many attempts on comprehensive maintenance test equipment. Either it is limited to the traditional test bench design method, and many redundant components are designed in the comprehensive test ben...

AI Technical Summary

Problems solved by technology

Either it is limited to the traditional test bench design method, and many redundant components are designed in the comprehensive test bench to meet the needs of different recorded equipment. , production cycle and manufacturing cost, which makes the detection operation not intuitive and inconvenient, and maintenance personnel are unwilling to use it; Few companies are willing to use this expensive instrument, so it is of little practical significance

Therefore, we can only use some boards and cards with unstable quality and performance to make some single-system integrated ATE equipment, but its performance is far from meeting the test requirements of the CMM manual

Images